print

Implementation-independent functional test for transition delay faults in microprocessors

author
Oyeniran, Adeboye Stephen
Ubar, Raimund-Johannes
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
location of publication
Danvers
publisher
IEEE
year of publication
2020
pages
p. 646-650
conference name, date
Euromicro Conference on Digital System Design : DSD 2020, 26-28 August 2020
conference location
Kranj, Slovenia
url
https://doi.org/10.1109/DSD51259.2020.00105
subject term
mikroprotsessorid
diagnostika (tehnika)
modelleerimine (teadus)
testimine
keyword
microprocessors
functional fault model
test generation
ISBN
978-1-7281-9535-3
notes
Bibliogr.: 33 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. Implementation-independent functional test for transition delay faults in microprocessors // 2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia. Danvers : IEEE, 2020. p. 646-650. https://doi.org/10.1109/DSD51259.2020.00105