Implementation-independent functional test for transition delay faults in microprocessors
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
source
location of publication
Danvers
publisher
year of publication
pages
p. 646-650
conference name, date
Euromicro Conference on Digital System Design : DSD 2020, 26-28 August 2020
conference location
Kranj, Slovenia
ISBN
978-1-7281-9535-3
notes
Bibliogr.: 33 ref
TTÜ department
language
inglise
Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. Implementation-independent functional test for transition delay faults in microprocessors // 2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia. Danvers : IEEE, 2020. p. 646-650.