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journal article EST / journal article ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Number of records 2, displaying 1 - 2

1. Safe Faults
2. Migration to Quantum-Safe Cryptography
3. safe driving in the dark
4. safe navigation
5. safe operation
6. safe-by-design
7. arc faults
8. Avoiding Mutual Masking of Multiple Faults
9. broken rotor bar faults
10. circuit faults
11. classification of faults
12. control faults
13. Cross-level Modeling of Faults in Digital Systems
14. faults
15. faults classification
16. faults in power system
17. hard-to-detect faults
18. high impedance faults
19. high-level control faults
20. indefinite faults
21. inter-disk and inter-turn faults
22. localization of faults
23. motor faults
24. multiple faults
25. non-robust and functional sensitization of delay faults
26. power distribution faults
27. power system faults
28. rotor faults
29. Single Stuck-at Faults
30. stuck-at-faults
31. tectonic faults
32. terms-transient faults
33. Test Group Generation for Detecting Multiple Faults
34. transient faults
35. transition delay faults
36. unknown faults
37. untestable faults

1. Estonian Center for Safe and Trustworthy Artificial Intelligence (ECSTAI)

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