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Fault oriented test pattern generation for sequential circuits using Genetic Algorithms (title)
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book article
Fault oriented test pattern generation for sequential circuits using Genetic Algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 129-132 : ill
book article
2
book article
Fault oriented test pattern generation for sequential circuits using genetic algorithms
Ivask, Eero
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 319-320
book article
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keyword
8
1.
automated test pattern generation
2.
automatic test pattern generation
3.
test generation and fault diagnosis
4.
genetic algorithms
5.
combinational and sequential circuits
6.
sequential circuits
7.
pattern Generation
8.
test-pattern
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