Optimization of the store-and-generate based built-in self-test (title)

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  • book article
    Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill
    book article
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