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Functional built-in self-test for processor cores in SoC (title)
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Functional built-in self-test for processor cores in SoC
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
;
Evartson, Teet
;
Orasson, Elmet
30th IEEE NORCHIP Conference : Copenhagen, Denmark, November 12-14, 2012
2012
/
p. 1-4 : ill
https://ieeexplore.ieee.org/document/6403148
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keyword
11
1.
built-in self-test
2.
logic built-in self-test
3.
functional self-test
4.
processor-centric board test
5.
functional test generation
6.
Automated Synthesis of Software-based Self-test
7.
self-test
8.
self-test architectures
9.
software based self-test
10.
software-based self-test
11.
software-based self-test (SBST)
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