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32901

journal article

Higher-spin equations with variable mass and spin and causalityLoide, Rein-Karl; Ots, Ilmar; Saar, Rein; Liivat, H.Hadronic journal2003 / p. 193-202 https://inspirehep.net/literature/634889

journal article

32902

book article

High-frequency automated observing systems to meet the monitoring and assessment needs in the Baltic Baltic SeaLips, Urmas; Lips, IngaAbstracts : [BSSC 2019]2019 / p. 20 https://www.su.se/polopoly_fs/1.446756.1566224624!/menu/standard/file/abstracts_A5_ny.pdf

book article

32903

book article

High-frequency current sensor for power network on-line mea[s]urementsKütt, Lauri; Järvik, Jaan; Vaimann, Toomas; Shafiq, Muhammad; Lehtonen, Matti; Kilter, JakoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 367-371 : ill https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements

book article

32904

book article

A high-frequency small-geometry MOSFET modelKanunnikov, A.I.; Shilin, V.A.Automation, simulation & measurement. Section A, Automation. Section M, Measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991 = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 29-33: ill https://www.ester.ee/record=b1064034*est

book article

32905

book article

High-frequency split-bobbin transformer design with adjustable leakage inductanceRahman, Showrov; Sidorov, Vadim; Chub, Andrii; Vinnikov, Dmitri2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 15-17 Nov. 2021 : conference proceedings2021 / p. 1-5 : ill https://doi.org/10.1109/RTUCON53541.2021.9711708

book article

Related publications 1

Universal galvanically isolated DC-DC converters with topology morphing control = Universaalsed topoloogiat muutva juhtimisega galvaaniliselt isoleeritud alalispingemuundurid

32906

book article

High-Frequency Step-Up DC-DC Converter with Integrated Ferrite-less InductancesMatiushkin, Oleksandr; Husev, Oleksandr; Gutiérrez-Escalona, Javier; Roncero-Clemente, Carlos; Romero-Cadaval, EnriquePCIM Europe 20252025 / 7 p

book article

32907

journal article

High-Gain Seven-Level Switched-Capacitor Two-Stage Multi-Level InverterAhmed, Hassan Yousif; Abdelrahim Abdelghafour, Omar Mohamed; Ali, Ziad M.Frontiers in Energy Research2022 / art. 869662 https://doi.org/10.3389/fenrg.2022.869662

journal article

32908

journal article EST / journal article ENG

High-intensity interval and moderate-intensity continuous training on cerebral energy metabolism in older rats.Marcourt, Cecile; Rivera, Claudio; Tuvikene, Jürgen; Langeard, Antoine; Esvald, Eli-Eelika; Cabrera-Cabrera, Florencia; Timmusk, Tõnis; Temprado, Jean-Jacques; Laurin, JeromeGeroScience2025 / 16 p https://doi.org/10.1007/s11357-025-01820-5

journal article EST / journal article ENG

32909

book article

High-K ZrO2 thin films by chemical spray pyrolysis method [Online resource]Oluwabi, Abayomi Titilope; Oja Acik, Ilona; Katerski, Atanas; Krunks, MalleTartu Ülikooli ASTRA projekt PER ASPERA : Funktsionaalsed materjalid ja tehnoloogiad : [7-8 märtsil 2018, Tallinn : teesid] GSFMT Scientific Conference 2018 : Tallinn, March 7-8, 2018 : abstracts2018 / 1 p http://fmtdk.ut.ee/teesid-2018/

book article

32910

journal article

High-key paljundusFotokunst1930 / lk. 153-154

journal article

32911

journal article EST / journal article ENG

High-level axioms for graphical linear algebraPaixao, Joao; Rufino, Lucas; Sobocinski, Pawel MariaScience of computer programming2022 / art. 102791 ; 26 p https://doi.org/10.1016/j.scico.2022.102791 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

32912

newspaper article

High-level CERN delegation visiting Estonia [Online resource]baltictimes.com2021 "High-level CERN delegation visiting Estonia"

newspaper article

32913

book article

High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

book article

32914

book article

High-level combined deterministic and pseudo-exhuastive test generation for RISC processorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Gürsoy, Cemil Cem; Raik, Jaan2019 IEEE European Test Symposium (ETS) : proceedings2019 / 6 p. : ill https://doi.org/10.1109/ETS.2019.8791526

book article

32915

book article

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

book article

32916

book article

High-Level Decision Diagram manipulations for code coverage analysisMinakova, Karina; Reinsalu, Uljana; Tšepurov, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 207-210 : ill

book article

32917

book article

High-level decision diagram simulation for diagnosis and soft-error analysisRaik, Jaan; Repinski, Urmas; Jenihhin, Maksim; Chepurov, AntonDesign and test technology for dependable systems-on-chip2011 / p. 294-309 : ill https://www.igi-global.com/chapter/high-level-decision-diagram-simulation/51406

book article

32918

book article

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

book article

32919

book article

High-level decision diagrams for improving simulation performance of digital systemsUbar, Raimund-Johannes; Raik, Jaan; Morawiec, AdamSCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems2000 / p. 62-67 : ill https://hal.science/hal-01396447v1

book article

32920

book article

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

book article

32921

book article

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

book article

32922

book article

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

book article

32923

journal article

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

journal article

32924

dissertation

High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontrollOyeniran, Adeboye Stephen2020 https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d

dissertation

32925

book article

High-level intellectual property obfuscation via decoy constantsAksoy, Levent; Nguyen, Quang-Linh; Almeida, Felipe; Raik, Jaan; Flottes, Marie-Lise; Dupuis, Sophie; Pagliarini, Samuel Nascimento2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 20212021 / p. 1-7 https://doi.org/10.1109/IOLTS52814.2021.9486714

book article

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