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High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test

author
statement of authorship
Adeboye Stephen Oyeniran, Maksim Jenihhin, Jaan Raik, Raimund Ubar
source
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
publisher
year of publication
pages
p. 32-37
conference name, date
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 04-06 July 2022
conference location
Nicosia, Cyprus
url
ISSN
2159-3477
2159-3469
ISBN
978-1-6654-6605-9
978-1-6654-6606-6
notes
Bibliogr.: 33 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Oyeniran, A.S., Jenihhin, M., Raik, J., Ubar, R. High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test // 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022. : IEEE, 2022. p. 32-37. https://doi.org/10.1109/ISVLSI54635.2022.00019