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26
book article
High level decision diagrams and characteristic polynomials
Karputkin, Anton
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 143-146 : ill
book article
27
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
28
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
29
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
30
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
31
book article
How to generate high quality tests for digital systems
Ubar, Raimund-Johannes
;
Aarna, Margit
;
Kruus, Helena
;
Raik, Jaan
2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 2
2004
/
p. 459-462 : ill
http://dx.doi.org/10.1109/SMICND.2004.1403048
book article
32
book article
Intelligent decision making approach for performance evaluation of a robot-based manufacturing cell
Kangru, Tavo
;
Riives, Jüri
;
Otto, Tauno
;
Pohlak, Meelis
;
Mahmood, Kashif
ASME 2018 International Mechanical Engineering Congress and Exposition : Pittsburgh, Pennsylvania, USA, November 9–15, 2018
2018
/
Paper No. IMECE2018-86666, pp. V002T02A092; 10 p. : ill
http://doi.org/10.1115/IMECE2018-86666
book article
33
book article
Multi-level fault simulation of digital systems on decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
The First IEEE International Workshop on Electronic Design, Test and Applications : DELTA 2002, 29-31 January 2002, Christchurch, New Zealand : proceedings
2002
/
p. 86-91 : ill
book article
34
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
35
book article
Multi-valued simulation of digital circuits with structurally synthesized binary decision diagrams
Ubar, Raimund-Johannes
Multiple valued logic. Vol. 4
1998
/
p. 141-157
book article
36
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
37
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
38
journal article
Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 303-324 : ill
http://dx.doi.org/10.2298/FUEE1103303U
journal article
39
book article
Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Proceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland
2011
/
p. 1-10 : ill
book article
40
book article
Parallel fault analysis on structurally synthesized BDDs
Devadze, Sergei
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 47-50 : ill
book article
41
journal article
PSL assertion checking using temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2009
/
6, p. 289-300 : ill
https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf
journal article
42
book article
PSL assertions based verification with HLDD tools
Jenihhin, Maksim
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 17-20 : ill
book article
43
journal article EST
/
journal article ENG
Ranking strategic objectives in a strategy map based on logarithmic fuzzy preference programming and similarity method
Safari, Hossein
;
Khanmohammadi, Ehsan
;
Maleki, Meysam
;
Cruz-Machado, Virgilio
;
Ševtšenko, Eduard
Management Systems in Production Engineering
2019
/
p. 153-161 : ill
https://doi.org/10.1515/mspe-2019-0025
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
44
book article
Register-transfer level deductive fault simulation using decision diagrams
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 193-196 : ill
book article
45
book article
Simulation-based verification with APRICOT framework using high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
East-West Design & Test Symposium : Moscow, September 18-21, 2009
2009
/
p. 13-16 : ill
book article
46
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
47
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
48
book
Software-based self-test with decision diagrams for microprocessors
Ubar, Raimund-Johannes
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Oyeniran, Adeboye Stephen
2018
book
49
book article
Structurally synthesized binary decision diagrams
Jutman, Artur
;
Peder, Ahti
;
Raik, Jaan
;
Tombak, Mati
;
Ubar, Raimund-Johannes
Boolean Problems : 6th International Workshop : September 23-24, 2004, Freiberg
2004
/
p. 271-278 : ill
book article
50
book article
Structurally synthesized multiple input BDDs for simulation of digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 2009
2009
/
p. 451-454 : ill
http://dx.doi.org/10.1109/ICECS.2009.5410895
book article
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