Combining functional and structural approaches in test generation for digital systems
author
statement of authorship
Raimund Ubar
source
publisher
journal volume number month
Vol. 38, 3
year of publication
pages
p. 317-329 : ill
notes
Bibliogr.: 33 ref
language
inglise
subject term
TalTech department
Ubar, R. Combining functional and structural approaches in test generation for digital systems // Microelectronics reliability (1998) Vol. 38, 3, p. 317-329 : ill.