A scalable technique to identify true critical paths in sequential circuits
statement of authorship
Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik
location of publication
Piscataway
publisher
year of publication
pages
p. 152-157 : ill
conference name, date
20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, April 19-21, 2017
conference location
Dresden, Germany
ISSN
2473-2117
ISBN
978-1-5386-0471-7
notes
Bibliogr.: 21 ref
TTÜ department
language
inglise
subject term
subject of form
Ubar, R., Kostin, S., Jenihhin, M., Raik, J. A scalable technique to identify true critical paths in sequential circuits // Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany. Piscataway : IEEE, 2017. p. 152-157 : ill.