On the estimation of complex circuits functional failure rate by machine learning techniques
statement of authorship
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
source
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
location of publication
[S.l.]
publisher
year of publication
pages
p. 35-41 : ill
conference name, date
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S), 24-27 June 2019
conference location
Portland, OR, USA
ISBN
978-1-7281-3028-6
notes
Bibliogr.: 14 ref
TTÜ department
language
inglise
subject term
keyword
Lange, T., Balakrishnan, A., Alexandrescu, D. et al. On the estimation of complex circuits functional failure rate by machine learning techniques // 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings. [S.l.] : IEEE, 2019. p. 35-41 : ill.