On the estimation of complex circuits functional failure rate by machine learning techniques
vastutusandmed
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
allikas
49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 35-41 : ill
konverentsi nimetus, aeg
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S), 24-27 June 2019
konverentsi toimumispaik
Portland, OR, USA
ISBN
978-1-7281-3028-6
märkused
Bibliogr.: 14 ref
TTÜ struktuuriüksus
keel
inglise
märksõna
võtmesõna
Uurimisrühm
Lange, T., Balakrishnan, A., Alexandrescu, D. et al. On the estimation of complex circuits functional failure rate by machine learning techniques // 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings. [S.l.] : IEEE, 2019. p. 35-41 : ill.