Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs

statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik
publisher
journal volume number month
vol. 77
year of publication
pages
art. 103117, 12 p
ISSN
0141-9331
notes
Bibliogr.: 43 ref
scientific publication
teaduspublikatsioon
classifier
1.1
category (general)
kvartiil
Q2
TTÜ department
language
inglise
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs // Microprocessors and microsystems (2020) vol. 77, art. 103117, 12 p. https://doi.org/10.1016/j.micpro.2020.103117