Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
statement of authorship
Lembit Jürimägi, Raimund Ubar, Maksim Jenihhin, Jaan Raik
publisher
journal volume number month
vol. 77
year of publication
pages
art. 103117, 12 p
subject term
keyword
ISSN
0141-9331
notes
Bibliogr.: 43 ref
scientific publication
teaduspublikatsioon
classifier
category (general)
category (sub)
kvartiil
TTÜ department
language
inglise
Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs // Microprocessors and microsystems (2020) vol. 77, art. 103117, 12 p. https://doi.org/10.1016/j.micpro.2020.103117