High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik
journal volume number month
vol. 36
year of publication
pages
p. 87-103
subject term
keyword
functional test generation
low-level fault redundancy
ISSN
0923-8174
notes
Bibliogr.: 43 ref
TTÜ department
language
inglise
Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors // Journal of electronic testing : theory and applications (2020) vol. 36, p. 87-103.