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High-level combined deterministic and pseudo-exhuastive test generation for RISC processors

author
statement of authorship
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik
source
location of publication
Danvers
publisher
year of publication
pages
6 p. : ill
conference name, date
2019 IEEE European Test Symposium ETS 2019, May 27 - 31, 2019
conference location
Baden Baden, Germany
url
ISSN
1558-1780
1530-1877
ISBN
978-1-7281-1173-5
978-1-7281-1174-2
notes
Bibliogr.: 31 ref
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Oyeniran, A. S., Ubar, R., Jenihhin, M., ; Gürsoy, C. C., Raik, J. High-level combined deterministic and pseudo-exhuastive test generation for RISC processors // 2019 IEEE European Test Symposium (ETS) : proceedings. Danvers : IEEE, 2019. 6 p. : ill. https://doi.org/10.1109/ETS.2019.8791526