Teaching digital test with BIST analyzer
author
statement of authorship
A. Jutman, A. Tsertov, A. Tsepurov, I. Aleksejev, R. Ubar, H.-D. Wuttke
location of publication
[S.l.]
publisher
year of publication
pages
p. 123-128 : ill
conference name, date
19th EAEEIE Annual Conference, June 29-July 2, 2008
conference location
Tallinn, Estonia
ISBN
978-1-4244-2008-7
notes
Bibliogr.: 8 ref
TalTech department
language
inglise
subject term
Jutman, A., Tšertov, A., Tšepurov, A., Aleksejev, I., Ubar, R., Wuttke, H.-D. Teaching digital test with BIST analyzer // 19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings. [S.l.] : IEEE, 2008. p. 123-128 : ill.