prindi

Constraints analysis in hierarchical test generation for digital systems

autor
Ubar, Raimund-Johannes
Krupnova, Helena
vastutusandmed
Raimund Ubar, Helena Krupnova
allikas
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
ilmumiskoht
Tallinn
ilmumisaasta
1994
leheküljed
p. 313-318: ill
märksõna
digitaaltehnika
testimine
testid
projekteerimine
ISBN
9985-59-012-0
märkused
Bibl. 26 ref
keel
inglise
Ubar, R., Krupnova, H. Constraints analysis in hierarchical test generation for digital systems // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 313-318: ill.