Fault diagnosis in the BIST environment based on bisection of detected faults
autor
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
vastutusandmed
Raimund Ubar, Sergei Kostin, Jaan Raik
allikas
LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru
ilmumiskoht
[S.l.]
ilmumisaasta
2007
leheküljed
[6] p. : ill
märkused
Bibliogr.: 16 ref