HyFBIST : hybrid functional built-in self-test in microprogrammed data-paths of digital systems
autor
Ubar, Raimund-Johannes
Mazurova, Natalja
Smahtina, Julia
Orasson, Elmet
Raik, Jaan
vastutusandmed
R.Ubar, N.Mazurova, J.Smahtina, E.Orasson, J.Raik
allikas
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
ilmumiskoht
[S. l.]
ilmumisaasta
2004
leheküljed
p. 497-502 : ill
märksõna
digitaaltehnika
diagnostika (tehnika)
testimine
ISBN
83-919289-7-7
märkused
Bibliogr.: 22 ref
keel
inglise