prindi

Fast and efficient static compaction of test sequences based on greedy algorithms

autor
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
vastutusandmed
J.Raik, A.Jutman, R.Ubar
allikas
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
ilmumiskoht
[S. l.]
ilmumisaasta
2001
leheküljed
p. 117-122
ISBN
963 7175 16 4
märkused
Bibliogr.: 13 ref
Raik, J., Jutman, A., Ubar, R. Fast and efficient static compaction of test sequences based on greedy algorithms // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 117-122.