Hierarchical test generation for combinational circuits with real defects coverage
autor
vastutusandmed
T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
allikas
ajakirja aastakäik number kuu
vol. 42, 7
ilmumisaasta
leheküljed
p. 1141-1149 : ill
ISSN
0026-2714
märkused
Bibliogr.: 25 ref
keel
inglise
Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J.* Hierarchical test generation for combinational circuits with real defects coverage // Microelectronics reliability (2002) vol. 42, 7, p. 1141-1149 : ill.