Latest trends in hardware security and privacy
                                            autor
                                    
                                    
Di Natale, Giorgio
                                                    
                                                    
Regazzoni, Francesco
                                                    
                                                    
Albanese, Vincent
                                                    
                                                    
Lhermet, Frank
                                                    
                                                    
Loisel, Yann
                                                    
                                                    
Sensaoui, Abderrahmane
                                                    
                                                    
                                            
                                            vastutusandmed
                                    
                                    
Giorgio Di Natale, Francesco Regazzoni, Vincent Albanese, Frank Lhermet, Yann Loisel, Abderrahmane Sensaoui, Samuel Pagliarini
                                                    
                                            
                                            allikas
                                    
                                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020
                                                    
                                            
                                            kirjastus/väljaandja
                                    
                                    
                                
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
4 p. : ill
                                                    
                                            
                                            konverentsi nimetus, aeg
                                    
                                    
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSIand Nanotechnology Systems (DFT), October 19–21, 2020
                                                    
                                            
                                            konverentsi toimumispaik
                                    
                                    
Frascati, Italy
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-7281-9457-8
                                                    
                                            
                                            märkused
                                    
                                    
Bibliogr.: 15 ref
                                                    
                                            
                                            Open Access
                                    
                                    
Open Access
                                                    
                                            
                                            teaduspublikatsioon
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            TTÜ struktuuriüksus
                                    
                                    
                                
                                            keel
                                    
                                    
inglise
                                                    
                                            
                                            võtmesõna
                                    
                                    
                                            klassifikaator
                                    
                                    
                                
                Uurimisrühm
            
            
        
                                    Di Natale, G., Regazzoni, F., Albanese, V., Pagliarini, S. et al. Latest trends in hardware security and privacy // 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 2020. : IEEE, 2020. 4 p. : ill.