prindi

Defect-oriented BIST quality analysis

autor
Kruus, Helena
Ubar, Raimund-Johannes
Raik, Jaan
vastutusandmed
H. Kruus, R. Ubar, J. Raik
allikas
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn University of Technology
ilmumisaasta
2010
leheküljed
p. 153-156 : ill
konverentsi nimetus, aeg
12th Biennial Baltic Electronics Conference, 2010
konverentsi toimumispaik
Tallinn
märksõna
VLSI-ahelad
testimine
diagnostika (tehnika)
kvaliteet
ISSN
1736-3705
ISBN
978-1-4244-7357-1
märkused
Bibliogr.: 18 ref
keel
inglise
Kruus, H., Ubar, R., Raik, J. Defect-oriented BIST quality analysis // BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia. [Tallinn] : Tallinn University of Technology, 2010. p. 153-156 : ill.