prindi

Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods

autor
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
vastutusandmed
Jaan Raik, Artur Jutman, Raimund Ubar
allikas
The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II
ilmumiskoht
Piscataway
kirjastus/väljaandja
IEEE
ilmumisaasta
2002
leheküljed
p. 445-448 : ill
konverentsi nimetus, aeg
9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, September 15-18, 2002
konverentsi toimumispaik
Dubrovnik, Croatia
leitav
http://dx.doi.org/10.1109/ICECS.2002.1046190
https://ieeexplore.ieee.org/document/1046190
märksõna
elektriahelad
testimine
ISBN
0-7803-7596-3
märkused
Bibliogr.: 7 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Raik, J., Jutman, A., Ubar, R.-J. Fast static compaction of tests composed of independent sequences : basic properties and comparison of methods // The 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II. Piscataway : IEEE, 2002. p. 445-448 : ill. http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190