Mixed-level deterministic-random test generation for digital systems
vastutusandmed                    
                    
G. Jervan, A. Markus, J. Raik, R. Ubar
                            
                    
ilmumiskoht                    
                    
[S.l.]
                            
                    
ilmumisaasta                    
                    
                
leheküljed                    
                    
p. 335-340
                            
                    
keel                    
                    
inglise
                            
                    
                            Jervan, G., Markus, A., Raik, J., Ubar, R. Mixed-level deterministic-random test generation for digital systems // Proceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 1998. [S.l.], 1998. p. 335-340.