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semiconductor device measurement (võtmesõna)

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Kirjeid leitud 2
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ekspordi kõik päringu tulemused (2)
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artikkel kogumikus

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

artikkel kogumikus
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
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artikkel ajakirjas EST / artikkel ajakirjas ENG

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Kirjeid leitud 2, kuvan 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device failure
4. semiconductor device manufacture
5. semiconductor device modeling
6. Semiconductor device packaging
7. semiconductor device reliability
8. device-to-device (D2D)
9. device-to-device (D2D) communication
10. device-to-device communication
11. cardiac device therapy
12. cooling device performance
13. Counter Improvised Explosive Device (C-IED)
14. device
15. device capacity
16. device characterisation
17. Device characterization
18. device modeling
19. device therapy
20. Discrete power device
21. energy saving device (ESD)
22. energy storage device
23. implantable medical device
24. Improvised Explosive Device (IED)
25. low-power device
26. massive device connectivity
27. medical device
28. metal semiconductor contacts
29. metal-oxide-semiconductor field-effect transistors (MOSFETs)
30. microfluidic device
31. motion-reduction device
32. on-device transfer learning
33. plasma-focus device
34. power semiconductor devices
35. power semiconductor switches
36. projected device density of states (PDDOS)
37. p-type transparent semiconductor
38. Real device
39. robotic device
40. semiconductor
41. semiconductor band bending
42. semiconductor crystals
43. semiconductor devices
44. semiconductor diodes
45. semiconductor doping
46. semiconductor heterojunctions
47. semiconductor technology
48. Semiconductor/electrolyte contact
49. semiconductor-metal transition
50. storage device
51. Superconducting device noise
52. Wearable device
53. wide band gap semiconductor devices
54. advanced measurement infrastructure
55. angle measurement
56. atmospheric measurement uncertainty
57. bioimpedance measurement
58. blood pressure measurement
59. blood sugar measurement
60. business school learning rate measurement instrument
61. characteristics of phasor measurement units
62. concentration measurement
63. Contactless conductivity measurement
64. continuous measurement
65. corrosion measurement
66. current measurement
67. Density measurement
68. differential measurement
69. distribution-level phasor measurement units (D-PMUs)
70. driving dynamics measurement
71. DTS measurement
72. dynamic measurement feedback
73. effect measurement
74. efficiency measurement
75. electric impedance measurement
76. electrical resistance measurement
77. electron density measurement
78. electronic measurement
79. employees' performance measurement
80. Energy efficiency measurement
81. experimental measurement
82. filter transmission measurement
83. flow measurement
84. force measurement
85. four-electrode impedance measurement
86. frequency measurement
87. harmonic measurement
88. high speed measurement
89. hygrothermal measurement and modelling
90. impedance measurement
91. impedance spectrum measurement
92. Inerial Measurement Unit (IMU)
93. inertial measurement unit
94. inertial measurement unit (IMU)
95. input/output current measurement
96. light measurement
97. lock-in measurement
98. loss measurement
99. losses measurement
100. magnetic measurement
101. maximum permissible error (deviation) of measurement result
102. measurement
103. measurement accuracy
104. measurement and testing
105. measurement by CCD cameras
106. measurement campaign
107. measurement coil
108. measurement error in household surveys
109. Measurement errors
110. measurement feedback
111. measurement gaps
112. measurement model
113. measurement standards
114. measurement uncertainty
115. measurement units
116. micro characterization and surface roughness measurement
117. mooring measurement
118. network measurement
119. non-contact optical measurement
120. non-invasive measurement
121. optical variables measurement
122. organizational learning measurement instruments
123. organizational learning rate measurement
124. partial discharge measurement
125. passive measurement
126. perfomance measurement
127. performance measurement
128. performance measurement system
129. phasor measurement
130. phasor measurement unit
131. Phasor measurement unit (PMU)
132. phasor measurement units
133. pollution measurement
134. position measurement
135. power measurement
136. power quality measurement
137. power quality measurement equipment
138. quality performance measurement
139. radiated EMI measurement
140. real-time measurement
141. road condition measurement
142. road performance measurement
143. single far-field measurement
144. single measurement
145. single-molecule measurement
146. Spectrophotometric measurement
147. static measurement feedback
148. synchronous measurement
149. temperature measurement
150. testing of phasor measurement units
151. Time measurement
152. torque measurement
153. tracer-gas measurement
154. tyre velocity measurement
155. wave height measurement
156. wave measurement
157. wear measurement
158. vibration measurement
159. voltage measurement

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