Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

semiconductor device measurement (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 2
Vaata veel.. (1/160)
Ekspordi

ekspordi kõik päringu tulemused (2)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

FPGA-based 16-bit 20 MHz device for the inductive measurement of electrical bio-impedancePriidel, Eiko; Pesti, Ksenija; Min, Mart; Ojarand, Jaan; Märtens, Olev2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2021), May 17-20, 2021 : proceedings2021 / 5 p. : ill https://doi.org/10.1109/I2MTC50364.2021.9460073

artikkel kogumikus
Seotud publikatsioonid 1
- Detection of changes in tissue state with the aid of electromagnetic interaction = Koe seisundi muutuste detekteerimine elektromagnetilise vastastikmõju abil
2

artikkel ajakirjas EST / artikkel ajakirjas ENG

Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina

Kirjeid leitud 2, kuvan 1 - 2

1. semiconductor device measurement
2. power semiconductor device
3. semiconductor device failure
4. semiconductor device manufacture
5. semiconductor device modeling
6. Semiconductor device packaging
7. semiconductor device reliability
8. device-to-device (D2D)
9. device-to-device (D2D) communication
10. device-to-device communication
11. cardiac device therapy
12. cooling device performance
13. Counter Improvised Explosive Device (C-IED)
14. device
15. device capacity
16. device characterisation
17. Device characterization
18. device modeling
19. device therapy
20. Discrete power device
21. energy saving device (ESD)
22. energy storage device
23. implantable medical device
24. Improvised Explosive Device (IED)
25. low-power device
26. massive device connectivity
27. medical device
28. metal semiconductor contacts
29. metal-oxide-semiconductor field-effect transistors (MOSFETs)
30. microfluidic device
31. motion-reduction device
32. on-device transfer learning
33. plasma-focus device
34. Portable device
35. power semiconductor devices
36. power semiconductor switches
37. projected device density of states (PDDOS)
38. p-type transparent semiconductor
39. Real device
40. robotic device
41. semiconductor
42. semiconductor band bending
43. semiconductor crystals
44. semiconductor devices
45. semiconductor diodes
46. semiconductor doping
47. semiconductor heterojunctions
48. semiconductor technology
49. Semiconductor/electrolyte contact
50. semiconductor-metal transition
51. storage device
52. Superconducting device noise
53. Wearable device
54. wide band gap semiconductor devices
55. advanced measurement infrastructure
56. angle measurement
57. atmospheric measurement uncertainty
58. bioimpedance measurement
59. blood pressure measurement
60. blood sugar measurement
61. business school learning rate measurement instrument
62. characteristics of phasor measurement units
63. concentration measurement
64. Contactless conductivity measurement
65. continuous measurement
66. corrosion measurement
67. current measurement
68. Density measurement
69. differential measurement
70. distribution-level phasor measurement units (D-PMUs)
71. driving dynamics measurement
72. DTS measurement
73. dynamic measurement feedback
74. effect measurement
75. efficiency measurement
76. electric impedance measurement
77. electrical resistance measurement
78. electron density measurement
79. electronic measurement
80. employees' performance measurement
81. Energy efficiency measurement
82. experimental measurement
83. filter transmission measurement
84. flow measurement
85. force measurement
86. four-electrode impedance measurement
87. frequency measurement
88. harmonic measurement
89. high speed measurement
90. hygrothermal measurement and modelling
91. impedance measurement
92. impedance spectrum measurement
93. Inerial Measurement Unit (IMU)
94. inertial measurement unit
95. inertial measurement unit (IMU)
96. input/output current measurement
97. light measurement
98. lock-in measurement
99. loss measurement
100. losses measurement
101. magnetic measurement
102. maximum permissible error (deviation) of measurement result
103. measurement
104. measurement accuracy
105. measurement and testing
106. measurement by CCD cameras
107. measurement campaign
108. measurement coil
109. measurement error in household surveys
110. Measurement errors
111. measurement feedback
112. measurement gaps
113. measurement model
114. measurement standards
115. measurement uncertainty
116. measurement units
117. micro characterization and surface roughness measurement
118. mooring measurement
119. network measurement
120. non-contact optical measurement
121. non-invasive measurement
122. optical variables measurement
123. organizational learning measurement instruments
124. organizational learning rate measurement
125. partial discharge measurement
126. passive measurement
127. perfomance measurement
128. performance measurement
129. performance measurement system
130. phasor measurement
131. phasor measurement unit
132. Phasor measurement unit (PMU)
133. phasor measurement units
134. pollution measurement
135. position measurement
136. power measurement
137. power quality measurement
138. power quality measurement equipment
139. quality performance measurement
140. radiated EMI measurement
141. real-time measurement
142. road condition measurement
143. road performance measurement
144. single far-field measurement
145. single measurement
146. single-molecule measurement
147. Spectrophotometric measurement
148. static measurement feedback
149. synchronous measurement
150. temperature measurement
151. testing of phasor measurement units
152. Time measurement
153. torque measurement
154. tracer-gas measurement
155. tyre velocity measurement
156. wave height measurement
157. wave measurement
158. wear measurement
159. vibration measurement
160. voltage measurement

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu