On antagonism between side-channel security and soft-error reliability in BNN inference engines
vastutusandmed
Xinhui Lai, Thomas Lange, Aneesh Balakrishnan, Dan Alexandrescu, Maksim Jenihhin
allikas
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 1-6
konverentsi nimetus, aeg
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC), 04-07 October 2021
konverentsi toimumispaik
Singapore
ISSN
2324-8440
ISBN
978-1-6654-2614-5
teaduspublikatsioon
teaduspublikatsioon
TTÜ struktuuriüksus
keel
inglise
märksõna
võtmesõna
Binarized Neural Network (BNN)
soft-error reliability
logical de-rating
Differential Power Analysis (DPA)
klassifikaator
Lai, X., Lange, T., Balakrishnan, A., Alexandrescu, D., Jenihhin, M. On antagonism between side-channel security and soft-error reliability in BNN inference engines // IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC). : IEEE, 2021. p. 1-6.