prindi

A global methodology for test program generation starting from high level specifications

autor
Storojev, Sergei
Leveugle, Regis
Saucier, Gabriele
vastutusandmed
Sergei Storojev, Regis Leveugle, Gabriele Saucier
allikas
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
ilmumiskoht
Tallinn
ilmumisaasta
1994
leheküljed
p. 305-311: ill
konverentsi nimetus, aeg
BEC : Baltic Electronics Conference, October 9-14, 1994,
konverentsi toimumispaik
Tallinn (Estonia)
leitav
https://www.ester.ee/record=b2150914*est
märksõna
testimine
testid
raalprojekteerimine
integraallülitused
ISBN
9985-59-012-0
märkused
Bibl. 4 ref
keel
inglise
Storojev, S., Leveugle, R., Saucier, G. A global methodology for test program generation starting from high level specifications // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 305-311: ill. https://www.ester.ee/record=b2150914*est