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artikkel kogumikus

A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill http://dx.doi.org/10.1109/NORCHP.2005.1597045

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A system for teaching basic and advanced topics of IEEE 1149.1 boundary scan standard (extended abstract)Jutman, Artur; Rosin, Vjatšeslav; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of 16th EAEEIE Conference on Innovation in Education for Electrical and Information Engineering (EIE) : Lappeenranta, Finland, 6th-8th June 20052005 / [2] p. : ill

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Address-based data processing over N-ary treesSklyarov, Valery; Skliarova, Iouliia; Kruus, Margus; Mihhailov, Dmitri; Sudnitsõn, AleksanderEuroCon 2013 : 01-04 July 2013, Zagreb, Croatia2013 / p. 1790-1797 : ill

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artikkel kogumikus

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

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raamat

Analog integrated circuits and signal processingEllervee, Peeter; Jervan, Gert2010

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artikkel kogumikus

Application specific true critical paths identification in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Oyeniran, Adeboye Stephen2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 299-304 : ill https://doi.org/10.1109/IOLTS.2019.8854442

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APRICOT : a framework for teaching digital systems verificationRaik, Jaan; Jenihhin, Maksim; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-Johannes19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 172-177 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610181

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artikkel ajakirjas

Arvuti nööpaugusAgur, UstusHorisont1976 / lk. 12-15 : ill https://www.ester.ee/record=b1072243*est http://www.digar.ee/id/nlib-digar:291330

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artikkel kogumikus

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

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artikkel ajakirjas

Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

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artikkel ajakirjas

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill http://dx.doi.org/10.1109/MDAT.2013.2271420

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artikkel ajakirjas

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319

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artikkel kogumikus

Benchmarking advanced security closure of physical layoutsEslami, Mohammad; Knechtel, Johann; Sinanoglu, Ozgur; Karri, Ramesh; Pagliarini, Samuel NascimentoISPD '23 : proceedings of the 2023 International Symposium on Physical Design2023 / p. 256-264 https://doi.org/10.1145/3569052.3578924 https://dl.acm.org/doi/pdf/10.1145/3569052.3578924

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Biotundlikud süsteemid molekulaarselt jäljendatud elektrit juhtivatest polümeeridestÖpik, Andres; Reut, Jekaterina; Sõritski, Vitali; Tretjakov, AlekseiTallinna Tehnikaülikooli aastaraamat 20122013 / lk. 40-44 : ill

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artikkel kogumikus

BIST analyzer : a training platform for SoC testing [Electronic resource]Jutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich37th Annual Frontiers in Education Conference : Global Engineering : Knowledge Without Borders, Opportunities Without Passports : Milwaukee, Wisconsin, October 10-13, 20072007 / p. S3H-8-S3H-13 : ill. [CD-ROM] http://dx.doi.org/10.1109/FIE.2007.4418125

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Capacitance measurement with MSP430 microcontrollersMärtens, Olev; Pille, Siim; Reidla, MarkoEDERC2014 : proceedings of the 6th European Embedded Design in Education and Research Conference, 11-12 September 2014, Milan, Italy2014 / p. 260-263 : ill

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artikkel ajakirjas

Capacitance-to-digital : a single chip detector for capillary electrophoresisDrevinskas, Tomas; Kaljurand, Mihkel; Maruška, AudriusElectrophoresis2014 / p. 2401-2407 : ill

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artikkel ajakirjas

Circuit simulation program oriented physical modeling of integrated circuit elementsRang, Toomas; Tarnay, K.; Szekely, V.Periodica polytechnica. Electrical engineering = Электротехника1980 / p. 37-45 https://www.ester.ee/record=b1198855*est

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artikkel kogumikus

Code coverage analysis for concurrent programming languages using high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesProceedings of the 12th European Workshop on Dependable Computing : EWDC 2009 : Toulouse, France, May 14-15, 20092009 / [4] p. : ill https://hal.archives-ouvertes.fr/hal-00381559

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artikkel ajakirjas

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

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artikkel ajakirjas

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

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DefSim - the defective ICPleskacz, Witold A.; Jutman, Artur; Ubar, Raimund-Johannes; Devadze, SergeiDATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 20072007 / p. s96 (2 p.)

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raamat

Design and test technology for dependable systems-on-chip2011 https://www.ester.ee/record=b4467408*est

raamat

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artikkel kogumikus

Design of a generalized fractional-order PID controller using operational amplifiersGonzalez, Emmanuel A.; Alimisis, Vassilis; Psychalinos, Costas; Tepljakov, Aleksei2018 25th IEEE International Conference on Electronics Circuits and Systems (ICECS), Bordeaux, France, December 9–12, 20182018 / p. 253-256 : ill http://dx.doi.org/10.1109/ICECS.2018.8617954

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Design space exploration and optimisation for NoC-based timing sensitive systemsTagel, Mihkel; Ellervee, Peeter; Jervan, GertInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / lk. 117-120 : ill

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