Registri loend: pealkiri
- Defect oriented fault coverage of 100stuck-at fault test sets (1)
- Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapour (1)
- Defect structure of Cu‐doped cadmium selenide (1)
- Defect structure of silver-doped cadmium telluride (1)
- Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy (1)
- Defect-oriented BIST quality analysis (1)
- Defect-oriented fault simulation and test generation in digital circuits (1)
- Defect-oriented library builder and hierarchical test generation (1)
- Defect-oriented mixed-level fault simulation in digital systems (1)
- Defect-oriented modul-level fault diagnosis in digital circuits (1)
- Defect-oriented test- and layout-generation for standard-cell ASIC designs (1)
- Defect-oriented test generation and fault simulation in the environment of MOSCITO (1)
- Defect-oriented test generation using probabilistic estimation (1)
- Defects and their formation processes in non-stoichiometric II-VI compoundes (1)
- Defects in CdTe-based photodetectors (1)
- Defects in chlorine doped CdTe thin films (1)
- Defects in chlorine-doped CdTe thin films (1)
- Defects in Cl and Na doped CdTe monograin powders (1)
- Defects, faults and fault models (1)
- Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne] (1)
- Defektide tasakaalu kinnikülmutamise arvutamine tsinksulfiidis (1)
- Defence industries in small European states : key contemporary challenges and opportunities (1)
- Definability of a torsion Abelian group by its semigroup of endomorphisms (1)
- Defining a BIM-enabled learning environment - an adaptive structuration theory perspective (1)
- Defining adaptivity (1)
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