Otsing - TalTech teadusportaal

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artikkel kogumikus

A global methodology for test program generation starting from high level specificationsStorojev, Sergei; Leveugle, Regis; Saucier, GabrieleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 305-311: ill https://www.ester.ee/record=b2150914*est

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A trap detector for precise measurements of optical radiation powerKübarsepp, Toomas; Kärhä, PetriBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 195-200: ill

artikkel kogumikus

3

artikkel kogumikus

Actual research topics in mechatronics system designGlesner, M.; Herpel, H.-J.; Kirschbaum, A.; Windirsch, P.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 85-91: ill

artikkel kogumikus

4

artikkel kogumikus

Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

artikkel kogumikus

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artikkel kogumikus

An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358

artikkel kogumikus

6

artikkel kogumikus

An interesting and effective code for error-correcting in mass-storage devicesSzepessy, AndrasBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 331-337

artikkel kogumikus

7

artikkel kogumikus

Assurance of gain stability of spaceborne teleradiometersVeismann, Uno; Min, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 179-185: ill

artikkel kogumikus

8

artikkel kogumikus

A CAD system for teaching digital testUbar, Raimund-Johannes; Ivask, Eero; Paomets, Priidu; Raik, JaanBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 369-372: ill

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Chaos in electronic circuitsLindberg, ErikBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 29-37: ill

artikkel kogumikus

10

artikkel kogumikus

Complementary Darlington circuitMännama, VelloBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 223-228: ill

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artikkel kogumikus

Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

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artikkel kogumikus

Design and application of lock-in instrumentsMin, MartBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 95-104: ill

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artikkel kogumikus

Different ways for optimization of settling time of the 3rd order phase locked loopTammemägi, JaakBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 239-243: ill

artikkel kogumikus

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artikkel kogumikus

Direct sequence spread spectrum digital radioKerek, Daniel; Saluvere, Teet; Tenhunen, HannuBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 159-167: ill

artikkel kogumikus

15

artikkel kogumikus

Elektrodenübergangsimpedanz bei bioelektrischen MessungenMärtin, HannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / S. 147-150: Ill

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artikkel kogumikus

Elements of noise modeling in bipolar semiconductor devicesBlum, AlfonsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 11-27

artikkel kogumikus

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artikkel kogumikus

Experimental study of ultrasonic microprocessor - based heat metersRagauskas, A.; Pamakstis, V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 141-145: ill

artikkel kogumikus

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artikkel kogumikus

Fault aliasing of signature analyzersKemnitz, Günter; Kärger, ReinhardBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 339-346: ill

artikkel kogumikus

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artikkel kogumikus

Hierarchical test generation for finite state machinesBrik, Marina; Ubar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 319-324: ill

artikkel kogumikus

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artikkel kogumikus

Identification of signal's sine-wave dominants using analysis of level crossingsRonk, AntsBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 233-238: ill

artikkel kogumikus

21

artikkel kogumikus

Infared and near-infared Fourier spectrometer PFS 2000 for analytical researchTõnnisson, T.; Lipping, Kalle; Pelt, Jaan; Raadi, G.; Randmets, R.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 169-172

artikkel kogumikus

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artikkel kogumikus

Information techniques for sensor- and microsystemsHolmer, R.; Tränkler, Hans-RolfBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 39-50: ill

artikkel kogumikus

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artikkel kogumikus

Intelligence system for design and investigation mechanical values sensorsShmakov, E.M.; Matveev, V.A.; Molotkov, S.V.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 261-269: ill

artikkel kogumikus

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artikkel kogumikus

Intelligent diagnostic centers: a new way to distributed fault-toleranceVarkonyi-Koczy, Annamaria R.; Tilly, K.; Dobrowiecki, Tadeusz; Vadasz, B.; Kiss, I.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 365-368: ill

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artikkel kogumikus

Low-noise CMOS-charge amplifier for a silicon strip detectorGrönlund, MarkoBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 217-222: ill

artikkel kogumikus

BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1 (allikas)

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