RT-level identification of potentially testable initialization faults
vastutusandmed
J.Raik, H.Fujiwara, A.Krivenko
allikas
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
ilmumiskoht
Sapporo
ilmumisaasta
leheküljed
[6] p
märksõna
keel
inglise
Raik, J., Fujiwara, H., Krivenko, A. RT-level identification of potentially testable initialization faults // The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan. Sapporo, 2008. [6] p.