täiskirje prindi

RT-level identification of potentially testable initialization faults

autor
vastutusandmed
J.Raik, H.Fujiwara, A.Krivenko
allikas
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
ilmumiskoht
Sapporo
ilmumisaasta
leheküljed
[6] p
leitav
keel
inglise
Raik, J., Fujiwara, H., Krivenko, A. RT-level identification of potentially testable initialization faults // The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan. Sapporo, 2008. [6] p. https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults