Efficient hierarchical approach to test generation for digital systems
vastutusandmed
Raimund Ubar, Jaan Raik
allikas
IEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California
ilmumiskoht
Los Alamitos, CA
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 189-195 : ill
ISBN
0-7695-0525-2
märkused
Bibliogr.: 19 ref
keel
inglise
Ubar, R., Raik, J. Efficient hierarchical approach to test generation for digital systems // IEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California. Los Alamitos, CA : IEEE Computer Society, 2000. p. 189-195 : ill.