prindi

A new measure for calculating multiple fault coverage of microprocessor self-test

autor
Oyeniran, Adeboye Stephen
Odozi, Uzochukwu Eddie
Ubar, Raimund-Johannes
vastutusandmed
Adeboye Stephen Oyeniran, Uzochukwu Eddie Odozi, Raimund Ubar
allikas
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
ilmumiskoht
Tallinn
kirjastus/väljaandja
Tallinn University of Technology
ilmumisaasta
2016
leheküljed
p. 75-78 : ill
konverentsi nimetus, aeg
2016 15th Biennial Baltic Electronics Conference, October 3-5, 2016
konverentsi toimumispaik
Tallinn, Tallinn University of Technology
leitav
http://www.ester.ee/record=b2150914*est
märksõna
riistvara
mikroprotsessorid
testimine
rikked
võtmesõna
microprocessors
control fault models
test program generation
high-level fault simulation
software-based self-test
ISBN
978-1-5090-1392-0
märkused
Bibliogr.: 14 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Oyeniran, A.S., Odozi, U.E., Ubar, R. A new measure for calculating multiple fault coverage of microprocessor self-test // BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2016. p. 75-78 : ill. http://www.ester.ee/record=b2150914*est