Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

test program generation (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 4
Vaata veel.. (2/245)
Ekspordi

ekspordi kõik päringu tulemused (4)
Salvesta TXT fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

artikkel kogumikus
2

artikkel kogumikus

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus
3

artikkel ajakirjas EST / artikkel ajakirjas ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
4

artikkel kogumikus

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

Kirjeid leitud 4, kuvan 1 - 4

1. automatic test program generation
2. test program generation
3. adaptive test strategy generation
4. automated test pattern generation
5. automatic test case generation
6. automatic test pattern generation
7. behaviour level test generation
8. functional test generation
9. Hierarchical Multi-level Test Generation
10. high-level test data generation
11. highlevel test generation
12. implementation-independent test generation
13. offline test generation
14. provably correct test generation
15. test generation
16. test generation and fault diagnosis
17. Test Group Generation for Detecting Multiple Faults
18. Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
19. Apollo program
20. automatic program synthesis
21. Baltic-wide HELCOM COMBINE monitoring program
22. BIP (Blended Intensive Program)
23. college program
24. European Program for Prevention
25. master program
26. monitoring program
27. NATO. Science for Peace and Security Program
28. probabilistic relational program logic
29. program
30. program analysis
31. program debugging
32. program equivalence
33. program management
34. program packages
35. program transformation
36. program verification
37. SNAP program
38. stufy program
39. Activity-based demand generation
40. automated code generation
41. automatic code generation
42. Automatic generation control
43. automatic GUI model generation
44. building and urban form generation
45. business model generation
46. code generation
47. data set generation
48. decentralized key generation
49. disaster alert generation
50. distributed electricity generation
51. distributed generation
52. Distributed Generation (DG)
53. distributed generation systems
54. distributed power generation
55. distrubuted power generation
56. droplet generation
57. droplet generation rate control
58. electric power generation
59. electricity generation
60. energy generation
61. extreme penetration level of non synchronous generation
62. feasible path generation
63. fifth generation computer
64. fourth generation district heating
65. frequent item generation
66. generation
67. generation and transmission expansion planning
68. Generation Costs
69. generation of electric energy
70. generation scheduling
71. generation succession
72. heat generation
73. hydroelectric power generation
74. hydrogen generation
75. I–III generation
76. job generation
77. knowledge generation
78. multisine generation
79. next generation 4D printing
80. next generation sequencing
81. Next-generation probiotics
82. next-generation sequencing
83. oil-shale power generation
84. pattern Generation
85. photovoltaic (PV) generation
86. photovoltaic generation dispatch
87. power generation
88. power generation dispatch
89. power generation economics
90. power generation planning
91. PV generation
92. PV power generation
93. Renewable energy generation
94. renewable generation
95. residual generation
96. rule generation
97. Second generation bioethanol
98. second generation of tribology models
99. second generation sequencing
100. signal generation
101. silver generation
102. solar power generation
103. space generation advisory council
104. template based sql generation
105. trajectory generation
106. waste generation
107. wave generation
108. white light generation
109. wind energy generation
110. wind generation
111. wind power generation
112. 16S rRNA gene amplicon next-generation sequencing
113. 4GDH (4th generation district heating)
114. 4th generation district heating
115. 5th generation district heating
116. accelerated shelf-life test
117. antigen test
118. Applications in Test Engineering
119. ASTM G65 dry sand rubber wheel abrasion test
120. Automated Synthesis of Software-based Self-test
121. automated test environment
122. Auvergne test-bed
123. battery test
124. behavioral test
125. bending test
126. bit-error rate test
127. Board and System Test
128. board test
129. bounds test
130. built-in self-test
131. capillary condensation redistribution test
132. chi-square test
133. closed bottle test
134. cognitive screening test
135. compartment fire test
136. compartment test
137. cone penetration test (CPT)
138. COVID-19 antigen test
139. cutting test
140. cybersecurity test bed
141. DDR4 interconnect test
142. design and test
143. design-for-test
144. deterministic test sequences
145. diagnostic test
146. digital test
147. Digital test and testable design
148. double-pulse test
149. drawing test
150. dry droplet antimicrobial test
151. embedded test
152. fan pressurisation test
153. final test result prediction
154. four-point bending test
155. FPGA based test
156. FPGA-Assisted Test
157. FPGA-centric test
158. functional self-test
159. Granger causality test
160. hardness test
161. high-level synthesis for test
162. high-speed serial link test
163. IEEE 9 bus test system
164. in situ tensile test in SEM
165. industrial field test
166. in-situ tensile test in SEM
167. Johansen cointegration test
168. Kolmogorov-Smirnov test
169. load test
170. logic built-in self-test
171. Luria alternating series test
172. Mann–Kendall test
173. Mann-Kendall trend test
174. memory interconnect test
175. microprocessor test
176. Model test
177. multiplier test
178. orthogonal test
179. package test analysis
180. parallel design and test
181. performance test
182. piezocone penetration test (CPTu)
183. Point Load Test index
184. pressurisation test
185. processor-centric board test
186. progressive damage test
187. pseudo-exhaustive test
188. purity test
189. real-time room temperature test
190. rolling thin film oven test
191. rtioco-based timed test sequences
192. seasonal Mann Kendall test
193. seismic piezocone penetration test
194. self-test
195. self-test architectures
196. sentence writing test
197. serial sevens test
198. ship towing test tank
199. similar material simulation test
200. small-scale fire test
201. small‐scale test
202. software based self-test
203. software-based self-test
204. software-based self-test (SBST)
205. soil phosphorus (P) test
206. standard test method
207. static load test
208. static-dynamic probing test (SDT)
209. stress test
210. system level test
211. teaching design and test of systems
212. tensile test
213. tensile test
214. test
215. test and evaluation platform
216. test automation
217. test bench
218. test coverage
219. test driven development
220. test driven modelling
221. test embankment
222. test equipment
223. test groups
224. test model design
225. test optimization
226. test packets
227. test path synthesis
228. test patterns
229. test point insertion
230. test reference year
231. test replication
232. test scenario description language
233. test-bed
234. test-chips
235. test-house
236. test-pattern
237. test-suite reduction
238. Three-point bending test
239. unit root test
240. usability platform test
241. 1995 ECC benchmark test

1. International Visitors Leadership Program
2. PHARE (programm). Farm Environmental Managing Program projekt)
3. European Test Symposium (ETS)
4. 16PF (test)

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu