prindi

Fast test pattern generation for sequential circuits using decision diagram representations

autor
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
Jaan Raik and Raimund Ubar
allikas
Journal of electronic testing : theory and applications (JETTA)
ajakirja aastakäik number kuu
Vol. 16
ilmumisaasta
2000
leheküljed
3, p. 213-226 : ill
leitav
https://link.springer.com/article/10.1023/A:1008335130158
märksõna
elektriahelad
testimine
ISSN
0923-8174
märkused
Bibliogr.: 21 ref
keel
inglise
Raik, J., Ubar, R. Fast test pattern generation for sequential circuits using decision diagram representations // Journal of electronic testing : theory and applications (JETTA) (2000) Vol. 16, 3, p. 213-226 : ill. https://link.springer.com/article/10.1023/A:1008335130158