Ubar, R., Raik, J., Paomets, P., Ivask, E., Jervan, G., Markus, A.

täiskirje prindi

Low-cost CAD system for teaching digital test

autor

Ubar, Raimund-Johannes

Raik, Jaan

Paomets, Priidu

Ivask, Eero

Jervan, Gert

Markus, Antti

vastutusandmed

R.Ubar, J.Raik, P.Paomets, E.Ivask, G.Jervan, A.Markus

allikas

Microelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 1996

ilmumiskoht

Singapore

kirjastus/väljaandja

World Scientific

ilmumisaasta

1996

leheküljed

p. 185-188

ISBN

981-02-2653-5

märkused

Bibl. 5 ref

Ubar, R., Raik, J., Paomets, P., Ivask, E., Jervan, G., Markus, A. Low-cost CAD system for teaching digital test // Microelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 1996. Singapore : World Scientific, 1996. p. 185-188.