prindi

Optimization of memory-constrained hybrid BIST for testing core-based systems

autor
Jervan, Gert
Kruus, Helena
Orasson, Elmet
Ubar, Raimund-Johannes
vastutusandmed
G.Jervan, H.Kruus, E.Orasson, R.Ubar
allikas
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE Computer Society
ilmumisaasta
2007
leheküljed
p. 71-77
leitav
https://ieeexplore.ieee.org/document/4297319
märksõna
testimine
digitaaltehnika
manussüsteemid
kiipvõrgud
rikked
keel
inglise
Jervan, G., Kruus, H., Orasson, E., Ubar, R.-J. Optimization of memory-constrained hybrid BIST for testing core-based systems // Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007. [S.l.] : IEEE Computer Society, 2007. p. 71-77. https://ieeexplore.ieee.org/document/4297319