prindi

Combining symbolic techniques with topological approach in test generation

autor
Ubar, Raimund-Johannes
vastutusandmed
R. Ubar
allikas
Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996
ilmumiskoht
[S.l.]
ilmumisaasta
1996
leheküljed
p. 377-382
keel
inglise
Ubar, R. Combining symbolic techniques with topological approach in test generation // Proceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 1996. [S.l.], 1996. p. 377-382.