prindi

Two-level simulation-based test generation for finite state machines

autor
Brik, Marina
Ubar, Raimund-Johannes
vastutusandmed
Marina Brik, Raimund Ubar
allikas
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
1999
leheküljed
p. 211-216: ill
ISBN
87-982637-2-2
märkused
Bibl. 8 ref
keel
inglise
Brik, M., Ubar, R. Two-level simulation-based test generation for finite state machines // 17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings. [S.l.] : IEEE, 1999. p. 211-216: ill.