prindi

Fault oriented test pattern generation for sequential circuits using Genetic Algorithms

autor
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
Eero Ivask, Jaan Raik, Raimund Ubar
allikas
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
Tallinn Technical University
ilmumisaasta
2000
leheküljed
p. 129-132 : ill
märksõna
geneetilised algoritmid
vead
ISBN
9985-59-179-8
märkused
Bibliogr.: 13 ref
keel
inglise
Ivask, E., Raik, J., Ubar, R. Fault oriented test pattern generation for sequential circuits using Genetic Algorithms // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 129-132 : ill.