Ubar, R., Jervan, G., Kruus, H., Orasson, E., Aleksejev, I.

prindi

Optimization of the store-and-generate based built-in self-test

autor

Ubar, Raimund-Johannes

Jervan, Gert

Kruus, Helena

Orasson, Elmet

Aleksejev, Igor

vastutusandmed

R.Ubar, G.Jervan, H.Kruus, E.Orasson, I.Aleksejev

allikas

BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference

ilmumiskoht

[Tallinn]

kirjastus/väljaandja

Tallinn University of Technology

ilmumisaasta

2006

leheküljed

p. 199-202 : ill

märksõna

integraallülitused

testimine

optimeerimine

ISBN

1-4244-0414-2

märkused

Bibliogr.: 17 ref

keel

inglise

Ubar, R., Jervan, G., Kruus, H., Orasson, E., Aleksejev, I. Optimization of the store-and-generate based built-in self-test // BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference. [Tallinn] : Tallinn University of Technology, 2006. p. 199-202 : ill.