Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
test equipment (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
4
Look more..
(2/150)
Export
export all inquiry results
(4)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Dynamic control system for electric motor drive testing on the test bench
Rassõlkin, Anton
;
Kallaste, Ants
;
Vaimann, Toomas
2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 2015
2015
/
p. 252-257 : ill
http://dx.doi.org/10.1109/CPE.2015.7231082
book article
2
book article
A library of samples for testing variable load electric drives
Liivik, Liisa
;
Vodovozov, Valery
;
Rassõlkin, Anton
Digest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering
2013
/
p. 12.1-12.6 : ill
book article
3
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
4
book article
Study of e-vehicle drive behaviour under changeable control
Rassõlkin, Anton
;
Vodovozov, Valery
;
Raud, Zoja
Digest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering
2013
/
p. 13.1-13.5 : ill
book article
Number of records 4, displaying
1 - 4
keyword
148
1.
test equipment
2.
bakery equipment
3.
hydraulic equipment
4.
manufacturing equipment
5.
material handling equipment
6.
optical communication equipment
7.
overall equipment effectiveness
8.
overall equipment effectiveness (OEE)
9.
overall equipment efficiency
10.
power quality measurement equipment
11.
price-sensitive model of flexible equipment
12.
technological equipment
13.
used equipment
14.
used industrial equipment
15.
virtual equipment
16.
accelerated shelf-life test
17.
adaptive test strategy generation
18.
antigen test
19.
ASTM G65 dry sand rubber wheel abrasion test
20.
automated test environment
21.
automated test pattern generation
22.
automatic test case generation
23.
automatic test pattern generation
24.
automatic test program generation
25.
Auvergne test-bed
26.
battery test
27.
behavioral test
28.
behaviour level test generation
29.
bending test
30.
bit-error rate test
31.
Board and System Test
32.
board test
33.
bounds test
34.
built-in self-test
35.
capillary condensation redistribution test
36.
chi-square test
37.
closed bottle test
38.
cognitive screening test
39.
compartment fire test
40.
compartment test
41.
cone penetration test (CPT)
42.
COVID-19 antigen test
43.
cutting test
44.
cybersecurity test bed
45.
DDR4 interconnect test
46.
design and test
47.
design-for-test
48.
deterministic test sequences
49.
diagnostic test
50.
digital test
51.
Digital test and testable design
52.
double-pulse test
53.
drawing test
54.
dry droplet antimicrobial test
55.
embedded test
56.
fan pressurisation test
57.
final test result prediction
58.
four-point bending test
59.
FPGA based test
60.
FPGA-Assisted Test
61.
FPGA-centric test
62.
functional self-test
63.
functional test generation
64.
Granger causality test
65.
hardness test
66.
high-level synthesis for test
67.
high-level test data generation
68.
highlevel test generation
69.
high-speed serial link test
70.
IEEE 9 bus test system
71.
implementation-independent test generation
72.
in situ tensile test in SEM
73.
industrial field test
74.
in-situ tensile test in SEM
75.
Johansen cointegration test
76.
Kolmogorov-Smirnov test
77.
load test
78.
logic built-in self-test
79.
Luria alternating series test
80.
Mann–Kendall test
81.
memory interconnect test
82.
microprocessor test
83.
Model test
84.
multiplier test
85.
offline test generation
86.
orthogonal test
87.
package test analysis
88.
parallel design and test
89.
performance test
90.
piezocone penetration test (CPTu)
91.
Point Load Test index
92.
pressurisation test
93.
processor-centric board test
94.
progressive damage test
95.
provably correct test generation
96.
pseudo-exhaustive test
97.
purity test
98.
rtioco-based timed test sequences
99.
seasonal Mann Kendall test
100.
seismic piezocone penetration test
101.
self-test
102.
self-test architectures
103.
sentence writing test
104.
serial sevens test
105.
ship towing test tank
106.
similar material simulation test
107.
small-scale fire test
108.
small‐scale test
109.
software based self-test
110.
software-based self-test
111.
software-based self-test (SBST)
112.
soil phosphorus (P) test
113.
standard test method
114.
static load test
115.
static-dynamic probing test (SDT)
116.
stress test
117.
system level test
118.
teaching design and test of systems
119.
tensile test
120.
test
121.
test and evaluation platform
122.
test automation
123.
test bench
124.
test coverage
125.
test driven development
126.
test driven modelling
127.
test embankment
128.
test generation
129.
test generation and fault diagnosis
130.
test groups
131.
test model design
132.
test optimization
133.
test packets
134.
test path synthesis
135.
test patterns
136.
test point insertion
137.
test program generation
138.
test reference year
139.
test replication
140.
test scenario description language
141.
test-bed
142.
test-chips
143.
test-house
144.
test-pattern
145.
test-suite reduction
146.
Three-point bending test
147.
unit root test
148.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT