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book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

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A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

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journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. Construction Equipment
4. electric control equipment
5. Electronic equipment
6. hydraulic equipment
7. manufacturing equipment
8. material handling equipment
9. optical communication equipment
10. overall equipment effectiveness
11. overall equipment effectiveness (OEE)
12. overall equipment efficiency
13. power quality measurement equipment
14. price-sensitive model of flexible equipment
15. substation equipment
16. technological equipment
17. used equipment
18. used industrial equipment
19. waste from electrical and electronic equipment
20. virtual equipment
21. accelerated shelf-life test
22. adaptive test strategy generation
23. antigen test
24. Applications in Test Engineering
25. ASTM G65 dry sand rubber wheel abrasion test
26. Automated Synthesis of Software-based Self-test
27. automated test environment
28. automated test pattern generation
29. automatic test case generation
30. automatic test pattern generation
31. automatic test program generation
32. Auvergne test-bed
33. battery test
34. behavioral test
35. behaviour level test generation
36. bending test
37. bit-error rate test
38. Board and System Test
39. board test
40. bounds test
41. built-in self-test
42. capillary condensation redistribution test
43. chi-square test
44. closed bottle test
45. cognitive screening test
46. compartment fire test
47. compartment test
48. cone penetration test (CPT)
49. COVID-19 antigen test
50. cutting test
51. cybersecurity test bed
52. DDR4 interconnect test
53. design and test
54. design-for-test
55. deterministic test sequences
56. diagnostic test
57. digital test
58. Digital test and testable design
59. double-pulse test
60. drawing test
61. dry droplet antimicrobial test
62. Embedded figures test
63. embedded test
64. fan pressurisation test
65. final test result prediction
66. four-point bending test
67. FPGA based test
68. FPGA-Assisted Test
69. FPGA-centric test
70. functional self-test
71. functional test generation
72. Granger causality test
73. hardness test
74. Hierarchical Multi-level Test Generation
75. high-level synthesis for test
76. high-level test data generation
77. highlevel test generation
78. high-speed serial link test
79. IEEE 9 bus test system
80. implementation-independent test generation
81. in situ tensile test in SEM
82. industrial field test
83. in-situ tensile test in SEM
84. Johansen cointegration test
85. Kolmogorov-Smirnov test
86. load test
87. logic built-in self-test
88. Luria alternating series test
89. Mann–Kendall test
90. Mann-Kendall trend test
91. memory interconnect test
92. microprocessor test
93. Model test
94. multiplier test
95. offline test generation
96. orthogonal test
97. package test analysis
98. parallel design and test
99. performance test
100. piezocone penetration test (CPTu)
101. Point Load Test index
102. pressurisation test
103. processor-centric board test
104. progressive damage test
105. provably correct test generation
106. pseudo-exhaustive test
107. purity test
108. real-time room temperature test
109. rolling thin film oven test
110. rtioco-based timed test sequences
111. seasonal Mann Kendall test
112. seismic piezocone penetration test
113. self-test
114. self-test architectures
115. sentence writing test
116. serial sevens test
117. ship towing test tank
118. similar material simulation test
119. small-scale fire test
120. small‐scale test
121. software based self-test
122. software-based self-test
123. software-based self-test (SBST)
124. soil phosphorus (P) test
125. standard test method
126. static load test
127. static-dynamic probing test (SDT)
128. stress test
129. system level test
130. teaching design and test of systems
131. tensile test
132. tensile test
133. test
134. test and evaluation platform
135. test automation
136. test bench
137. test coverage
138. test driven development
139. test driven modelling
140. test embankment
141. test generation
142. test generation and fault diagnosis
143. Test Group Generation for Detecting Multiple Faults
144. test groups
145. test model design
146. test optimization
147. test packets
148. test path synthesis
149. test patterns
150. test point insertion
151. test program generation
152. test reference year
153. test replication
154. test scenario description language
155. test-bed
156. test-chips
157. test-house
158. test-pattern
159. test-suite reduction
160. Three-point bending test
161. unit root test
162. usability platform test
163. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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