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book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

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A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

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journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. electric control equipment
4. Electronic equipment
5. hydraulic equipment
6. manufacturing equipment
7. material handling equipment
8. optical communication equipment
9. overall equipment effectiveness
10. overall equipment effectiveness (OEE)
11. overall equipment efficiency
12. power quality measurement equipment
13. price-sensitive model of flexible equipment
14. technological equipment
15. used equipment
16. used industrial equipment
17. waste from electrical and electronic equipment
18. virtual equipment
19. accelerated shelf-life test
20. adaptive test strategy generation
21. antigen test
22. Applications in Test Engineering
23. ASTM G65 dry sand rubber wheel abrasion test
24. Automated Synthesis of Software-based Self-test
25. automated test environment
26. automated test pattern generation
27. automatic test case generation
28. automatic test pattern generation
29. automatic test program generation
30. Auvergne test-bed
31. battery test
32. behavioral test
33. behaviour level test generation
34. bending test
35. bit-error rate test
36. Board and System Test
37. board test
38. bounds test
39. built-in self-test
40. capillary condensation redistribution test
41. chi-square test
42. closed bottle test
43. cognitive screening test
44. compartment fire test
45. compartment test
46. cone penetration test (CPT)
47. COVID-19 antigen test
48. cutting test
49. cybersecurity test bed
50. DDR4 interconnect test
51. design and test
52. design-for-test
53. deterministic test sequences
54. diagnostic test
55. digital test
56. Digital test and testable design
57. double-pulse test
58. drawing test
59. dry droplet antimicrobial test
60. embedded test
61. fan pressurisation test
62. final test result prediction
63. four-point bending test
64. FPGA based test
65. FPGA-Assisted Test
66. FPGA-centric test
67. functional self-test
68. functional test generation
69. Granger causality test
70. hardness test
71. Hierarchical Multi-level Test Generation
72. high-level synthesis for test
73. high-level test data generation
74. highlevel test generation
75. high-speed serial link test
76. IEEE 9 bus test system
77. implementation-independent test generation
78. in situ tensile test in SEM
79. industrial field test
80. in-situ tensile test in SEM
81. Johansen cointegration test
82. Kolmogorov-Smirnov test
83. load test
84. logic built-in self-test
85. Luria alternating series test
86. Mann–Kendall test
87. Mann-Kendall trend test
88. memory interconnect test
89. microprocessor test
90. Model test
91. multiplier test
92. offline test generation
93. orthogonal test
94. package test analysis
95. parallel design and test
96. performance test
97. piezocone penetration test (CPTu)
98. Point Load Test index
99. pressurisation test
100. processor-centric board test
101. progressive damage test
102. provably correct test generation
103. pseudo-exhaustive test
104. purity test
105. real-time room temperature test
106. rolling thin film oven test
107. rtioco-based timed test sequences
108. seasonal Mann Kendall test
109. seismic piezocone penetration test
110. self-test
111. self-test architectures
112. sentence writing test
113. serial sevens test
114. ship towing test tank
115. similar material simulation test
116. small-scale fire test
117. small‐scale test
118. software based self-test
119. software-based self-test
120. software-based self-test (SBST)
121. soil phosphorus (P) test
122. standard test method
123. static load test
124. static-dynamic probing test (SDT)
125. stress test
126. system level test
127. teaching design and test of systems
128. tensile test
129. tensile test
130. test
131. test and evaluation platform
132. test automation
133. test bench
134. test coverage
135. test driven development
136. test driven modelling
137. test embankment
138. test generation
139. test generation and fault diagnosis
140. Test Group Generation for Detecting Multiple Faults
141. test groups
142. test model design
143. test optimization
144. test packets
145. test path synthesis
146. test patterns
147. test point insertion
148. test program generation
149. test reference year
150. test replication
151. test scenario description language
152. test-bed
153. test-chips
154. test-house
155. test-pattern
156. test-suite reduction
157. Three-point bending test
158. unit root test
159. usability platform test
160. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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