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book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

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book article

A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

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journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. hydraulic equipment
4. manufacturing equipment
5. material handling equipment
6. optical communication equipment
7. overall equipment effectiveness
8. overall equipment effectiveness (OEE)
9. overall equipment efficiency
10. power quality measurement equipment
11. price-sensitive model of flexible equipment
12. technological equipment
13. used equipment
14. used industrial equipment
15. accelerated shelf-life test
16. adaptive test strategy generation
17. antigen test
18. ASTM G65 dry sand rubber wheel abrasion test
19. automated test environment
20. automated test pattern generation
21. automatic test case generation
22. automatic test pattern generation
23. automatic test program generation
24. Auvergne test-bed
25. battery test
26. behavioral test
27. behaviour level test generation
28. bending test
29. bit-error rate test
30. Board and System Test
31. board test
32. bounds test
33. built-in self-test
34. capillary condensation redistribution test
35. chi-square test
36. closed bottle test
37. cognitive screening test
38. compartment fire test
39. compartment test
40. cone penetration test (CPT)
41. COVID-19 antigen test
42. cutting test
43. cybersecurity test bed
44. DDR4 interconnect test
45. design and test
46. design-for-test
47. deterministic test sequences
48. diagnostic test
49. digital test
50. Digital test and testable design
51. double-pulse test
52. drawing test
53. dry droplet antimicrobial test
54. embedded test
55. fan pressurisation test
56. final test result prediction
57. four-point bending test
58. FPGA based test
59. FPGA-Assisted Test
60. FPGA-centric test
61. functional self-test
62. functional test generation
63. Granger causality test
64. hardness test
65. high-level synthesis for test
66. high-level test data generation
67. highlevel test generation
68. high-speed serial link test
69. IEEE 9 bus test system
70. implementation-independent test generation
71. in situ tensile test in SEM
72. industrial field test
73. in-situ tensile test in SEM
74. Johansen cointegration test
75. Kolmogorov-Smirnov test
76. load test
77. logic built-in self-test
78. Luria alternating series test
79. Mann–Kendall test
80. memory interconnect test
81. microprocessor test
82. Model test
83. multiplier test
84. offline test generation
85. orthogonal test
86. package test analysis
87. parallel design and test
88. performance test
89. piezocone penetration test (CPTu)
90. Point Load Test index
91. pressurisation test
92. processor-centric board test
93. progressive damage test
94. provably correct test generation
95. pseudo-exhaustive test
96. purity test
97. rtioco-based timed test sequences
98. seasonal Mann Kendall test
99. seismic piezocone penetration test
100. self-test
101. self-test architectures
102. sentence writing test
103. serial sevens test
104. ship towing test tank
105. similar material simulation test
106. small-scale fire test
107. small‐scale test
108. software based self-test
109. software-based self-test
110. software-based self-test (SBST)
111. soil phosphorus (P) test
112. standard test method
113. static load test
114. static-dynamic probing test (SDT)
115. stress test
116. system level test
117. teaching design and test of systems
118. tensile test
119. test
120. test and evaluation platform
121. test bench
122. test coverage
123. test driven development
124. test driven modelling
125. test embankment
126. test generation
127. test generation and fault diagnosis
128. test groups
129. test model design
130. test optimization
131. test packets
132. test path synthesis
133. test patterns
134. test point insertion
135. test program generation
136. test reference year
137. test replication
138. test scenario description language
139. test-bed
140. test-chips
141. test-house
142. test-pattern
143. test-suite reduction
144. Three-point bending test
145. unit root test
146. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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