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book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

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A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

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journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. electric control equipment
4. Electronic equipment
5. hydraulic equipment
6. manufacturing equipment
7. material handling equipment
8. optical communication equipment
9. overall equipment effectiveness
10. overall equipment effectiveness (OEE)
11. overall equipment efficiency
12. power quality measurement equipment
13. price-sensitive model of flexible equipment
14. technological equipment
15. used equipment
16. used industrial equipment
17. waste from electrical and electronic equipment
18. virtual equipment
19. accelerated shelf-life test
20. adaptive test strategy generation
21. antigen test
22. Applications in Test Engineering
23. ASTM G65 dry sand rubber wheel abrasion test
24. Automated Synthesis of Software-based Self-test
25. automated test environment
26. automated test pattern generation
27. automatic test case generation
28. automatic test pattern generation
29. automatic test program generation
30. Auvergne test-bed
31. battery test
32. behavioral test
33. behaviour level test generation
34. bending test
35. bit-error rate test
36. Board and System Test
37. board test
38. bounds test
39. built-in self-test
40. capillary condensation redistribution test
41. chi-square test
42. closed bottle test
43. cognitive screening test
44. compartment fire test
45. compartment test
46. cone penetration test (CPT)
47. COVID-19 antigen test
48. cutting test
49. cybersecurity test bed
50. DDR4 interconnect test
51. design and test
52. design-for-test
53. deterministic test sequences
54. diagnostic test
55. digital test
56. Digital test and testable design
57. double-pulse test
58. drawing test
59. dry droplet antimicrobial test
60. embedded test
61. fan pressurisation test
62. final test result prediction
63. four-point bending test
64. FPGA based test
65. FPGA-Assisted Test
66. FPGA-centric test
67. functional self-test
68. functional test generation
69. Granger causality test
70. hardness test
71. Hierarchical Multi-level Test Generation
72. high-level synthesis for test
73. high-level test data generation
74. highlevel test generation
75. high-speed serial link test
76. IEEE 9 bus test system
77. implementation-independent test generation
78. in situ tensile test in SEM
79. industrial field test
80. in-situ tensile test in SEM
81. Johansen cointegration test
82. Kolmogorov-Smirnov test
83. load test
84. logic built-in self-test
85. Luria alternating series test
86. Mann–Kendall test
87. memory interconnect test
88. microprocessor test
89. Model test
90. multiplier test
91. offline test generation
92. orthogonal test
93. package test analysis
94. parallel design and test
95. performance test
96. piezocone penetration test (CPTu)
97. Point Load Test index
98. pressurisation test
99. processor-centric board test
100. progressive damage test
101. provably correct test generation
102. pseudo-exhaustive test
103. purity test
104. rolling thin film oven test
105. rtioco-based timed test sequences
106. seasonal Mann Kendall test
107. seismic piezocone penetration test
108. self-test
109. self-test architectures
110. sentence writing test
111. serial sevens test
112. ship towing test tank
113. similar material simulation test
114. small-scale fire test
115. small‐scale test
116. software based self-test
117. software-based self-test
118. software-based self-test (SBST)
119. soil phosphorus (P) test
120. standard test method
121. static load test
122. static-dynamic probing test (SDT)
123. stress test
124. system level test
125. teaching design and test of systems
126. tensile test
127. tensile test
128. test
129. test and evaluation platform
130. test automation
131. test bench
132. test coverage
133. test driven development
134. test driven modelling
135. test embankment
136. test generation
137. test generation and fault diagnosis
138. Test Group Generation for Detecting Multiple Faults
139. test groups
140. test model design
141. test optimization
142. test packets
143. test path synthesis
144. test patterns
145. test point insertion
146. test program generation
147. test reference year
148. test replication
149. test scenario description language
150. test-bed
151. test-chips
152. test-house
153. test-pattern
154. test-suite reduction
155. Three-point bending test
156. unit root test
157. usability platform test
158. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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