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book article

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level

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Number of records 2, displaying 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. across-the-board cuts
5. board
6. board composition
7. board diagnosis
8. board diversity
9. board of directors
10. Estonian Police and Border Guard Board (PPA)
11. laminate embedded printed circuit board
12. off-board charger
13. off-board charger (OBC)
14. off-board chargers
15. on-board charger (OBC)
16. on-board chargers
17. processor-centric board
18. single board computer
19. single-board computer
20. accelerated shelf-life test
21. adaptive test strategy generation
22. antigen test
23. Applications in Test Engineering
24. ASTM G65 dry sand rubber wheel abrasion test
25. Automated Synthesis of Software-based Self-test
26. automated test environment
27. automated test pattern generation
28. automatic test case generation
29. automatic test pattern generation
30. automatic test program generation
31. Auvergne test-bed
32. battery test
33. behavioral test
34. behaviour level test generation
35. bending test
36. bit-error rate test
37. bounds test
38. built-in self-test
39. capillary condensation redistribution test
40. chi-square test
41. closed bottle test
42. cognitive screening test
43. compartment fire test
44. compartment test
45. cone penetration test (CPT)
46. COVID-19 antigen test
47. cutting test
48. cybersecurity test bed
49. DDR4 interconnect test
50. design and test
51. design-for-test
52. deterministic test sequences
53. diagnostic test
54. digital test
55. Digital test and testable design
56. double-pulse test
57. drawing test
58. dry droplet antimicrobial test
59. embedded test
60. fan pressurisation test
61. final test result prediction
62. four-point bending test
63. FPGA based test
64. FPGA-Assisted Test
65. FPGA-centric test
66. functional self-test
67. functional test generation
68. Granger causality test
69. hardness test
70. Hierarchical Multi-level Test Generation
71. high-level synthesis for test
72. high-level test data generation
73. highlevel test generation
74. high-speed serial link test
75. IEEE 9 bus test system
76. implementation-independent test generation
77. in situ tensile test in SEM
78. industrial field test
79. in-situ tensile test in SEM
80. Johansen cointegration test
81. Kolmogorov-Smirnov test
82. load test
83. logic built-in self-test
84. Luria alternating series test
85. Mann–Kendall test
86. memory interconnect test
87. microprocessor test
88. Model test
89. multiplier test
90. offline test generation
91. orthogonal test
92. package test analysis
93. parallel design and test
94. performance test
95. piezocone penetration test (CPTu)
96. Point Load Test index
97. pressurisation test
98. progressive damage test
99. provably correct test generation
100. pseudo-exhaustive test
101. purity test
102. rolling thin film oven test
103. rtioco-based timed test sequences
104. seasonal Mann Kendall test
105. seismic piezocone penetration test
106. self-test
107. self-test architectures
108. sentence writing test
109. serial sevens test
110. ship towing test tank
111. similar material simulation test
112. small-scale fire test
113. small‐scale test
114. software based self-test
115. software-based self-test
116. software-based self-test (SBST)
117. soil phosphorus (P) test
118. standard test method
119. static load test
120. static-dynamic probing test (SDT)
121. stress test
122. system level test
123. teaching design and test of systems
124. tensile test
125. tensile test
126. test
127. test and evaluation platform
128. test automation
129. test bench
130. test coverage
131. test driven development
132. test driven modelling
133. test embankment
134. test equipment
135. test generation
136. test generation and fault diagnosis
137. Test Group Generation for Detecting Multiple Faults
138. test groups
139. test model design
140. test optimization
141. test packets
142. test path synthesis
143. test patterns
144. test point insertion
145. test program generation
146. test reference year
147. test replication
148. test scenario description language
149. test-bed
150. test-chips
151. test-house
152. test-pattern
153. test-suite reduction
154. Three-point bending test
155. unit root test
156. usability platform test
157. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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