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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. As-built
11. as-built model
12. as-built survey
13. built environment
14. built environment and architecture
15. built environment investment
16. built environment skills needs
17. Built Heritage
18. built in moisture
19. built-in moisture
20. Built-in transformer (BIT)
21. cultural built heritage
22. hand-built pottery
23. sustainable built environment
24. adolescent self-efficacy
25. association of local-self government
26. association of local-self governments
27. corporate energy self-sufficiency
28. covalent self-assembly in solid state
29. desired self-identity
30. diffusion and self-trapping of charge carriers
31. digital self-determination
32. digital self-efficacy
33. digital self-interference cancellation
34. European charter of local self-government
35. European self-sovereign identity framework
36. high strength self-compacting concrete
37. income of self-employed
38. increased self-consumption
39. local self-government
40. nikel-based self-fluxing alloy
41. NiP self-lubricating coating
42. open self‐ventilated machines
43. optical self-mixing
44. OSV (open self‐ventilated) machines
45. perceived general self-efficacy
46. renewables self-consumption
47. Self assessment tool
48. self aware
49. self learning software
50. self learning system
51. Self organization
52. self organizing map
53. self organizing network
54. self regulating heating
55. self regulation
56. self-analysis
57. self-assembled monolayers
58. self-assembly
59. self-assessed quality of life
60. self-assessment
61. self-assessment tool
62. self-attribution
63. self-aware
64. self-aware contracts
65. self-aware systems
66. self-awareness
67. self-checking
68. self-cleaning surfaces
69. self-consistent channels
70. self-consumption
71. self-costs
72. self-defence
73. self-determination
74. self-determination theory
75. self-determination theory of work motivation
76. self-development
77. self-driving car
78. self-driving cars
79. self-driving minibus
80. self-driving vehicle
81. self-driving vehicles
82. self-efficacy
83. self-efficacy development
84. self-employed
85. self-employment
86. self-evaluation
87. self-fluxing alloy
88. self-governance
89. self-healing
90. self-heating phenomenon
91. self-identification
92. self-identity
93. self-improvement
94. self-insurance
95. self-learning
96. self-lubrication
97. self-management
98. self‐management
99. self-mixing
100. self-organisation
101. self-organised teams
102. self-organization
103. self-organized criticality
104. self-organized teams
105. self-perforating dowel
106. self-propagating high temperature synthesized (SHS)
107. Self-Propagating High-Temperature Synthesis
108. self-propulsion
109. self-regulated learning
110. self-regulation
111. self-reported musculoskeletal disorders
112. self-rolling
113. self-shading envelopes
114. self-sovereign
115. self-study
116. self-study courses
117. self-training
118. social self-development
119. solo self-employment
120. accelerated shelf-life test
121. adaptive test strategy generation
122. antigen test
123. Applications in Test Engineering
124. ASTM G65 dry sand rubber wheel abrasion test
125. automated test environment
126. automated test pattern generation
127. automatic test case generation
128. automatic test pattern generation
129. automatic test program generation
130. Auvergne test-bed
131. battery test
132. behavioral test
133. behaviour level test generation
134. bending test
135. bit-error rate test
136. Board and System Test
137. board test
138. bounds test
139. capillary condensation redistribution test
140. chi-square test
141. closed bottle test
142. cognitive screening test
143. compartment fire test
144. compartment test
145. cone penetration test (CPT)
146. COVID-19 antigen test
147. cutting test
148. cybersecurity test bed
149. DDR4 interconnect test
150. design and test
151. design-for-test
152. deterministic test sequences
153. diagnostic test
154. digital test
155. Digital test and testable design
156. double-pulse test
157. drawing test
158. dry droplet antimicrobial test
159. embedded test
160. fan pressurisation test
161. final test result prediction
162. four-point bending test
163. FPGA based test
164. FPGA-Assisted Test
165. FPGA-centric test
166. functional test generation
167. Granger causality test
168. hardness test
169. Hierarchical Multi-level Test Generation
170. high-level synthesis for test
171. high-level test data generation
172. highlevel test generation
173. high-speed serial link test
174. IEEE 9 bus test system
175. implementation-independent test generation
176. in situ tensile test in SEM
177. industrial field test
178. in-situ tensile test in SEM
179. Johansen cointegration test
180. Kolmogorov-Smirnov test
181. load test
182. Luria alternating series test
183. Mann–Kendall test
184. Mann-Kendall trend test
185. memory interconnect test
186. microprocessor test
187. Model test
188. multiplier test
189. offline test generation
190. orthogonal test
191. package test analysis
192. parallel design and test
193. performance test
194. piezocone penetration test (CPTu)
195. Point Load Test index
196. pressurisation test
197. processor-centric board test
198. progressive damage test
199. provably correct test generation
200. pseudo-exhaustive test
201. purity test
202. real-time room temperature test
203. rolling thin film oven test
204. rtioco-based timed test sequences
205. seasonal Mann Kendall test
206. seismic piezocone penetration test
207. sentence writing test
208. serial sevens test
209. ship towing test tank
210. similar material simulation test
211. small-scale fire test
212. small‐scale test
213. soil phosphorus (P) test
214. standard test method
215. static load test
216. static-dynamic probing test (SDT)
217. stress test
218. system level test
219. teaching design and test of systems
220. tensile test
221. tensile test
222. test
223. test and evaluation platform
224. test automation
225. test bench
226. test coverage
227. test driven development
228. test driven modelling
229. test embankment
230. test equipment
231. test generation
232. test generation and fault diagnosis
233. Test Group Generation for Detecting Multiple Faults
234. test groups
235. test model design
236. test optimization
237. test packets
238. test path synthesis
239. test patterns
240. test point insertion
241. test program generation
242. test reference year
243. test replication
244. test scenario description language
245. test-bed
246. test-chips
247. test-house
248. test-pattern
249. test-suite reduction
250. Three-point bending test
251. unit root test
252. usability platform test
253. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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