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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. Self-assembly and Self-organization
11. As-built
12. as-built model
13. as-built survey
14. built environment
15. built environment and architecture
16. built environment investment
17. built environment skills needs
18. Built Heritage
19. built in moisture
20. built-in moisture
21. Built-in transformer (BIT)
22. cultural built heritage
23. hand-built pottery
24. sustainable built environment
25. adolescent self-efficacy
26. association of local-self government
27. association of local-self governments
28. corporate energy self-sufficiency
29. covalent self-assembly in solid state
30. desired self-identity
31. diffusion and self-trapping of charge carriers
32. digital self-determination
33. digital self-efficacy
34. digital self-interference cancellation
35. European charter of local self-government
36. European self-sovereign identity framework
37. high strength self-compacting concrete
38. income of self-employed
39. increased self-consumption
40. local self-government
41. nikel-based self-fluxing alloy
42. NiP self-lubricating coating
43. open self‐ventilated machines
44. optical self-mixing
45. OSV (open self‐ventilated) machines
46. perceived general self-efficacy
47. renewables self-consumption
48. Self assessment tool
49. self aware
50. self learning software
51. self learning system
52. Self organization
53. self organizing map
54. self organizing network
55. self regulating heating
56. self regulation
57. self-analysis
58. self-assembled monolayers
59. self-assembly
60. self-assessed quality of life
61. self-assessment
62. self-assessment tool
63. self-attribution
64. self-aware
65. self-aware contracts
66. self-aware systems
67. self-awareness
68. self-checking
69. self-cleaning surfaces
70. self-consistent channels
71. self-consumption
72. self-costs
73. self-defence
74. self-determination
75. self-determination theory
76. self-determination theory of work motivation
77. self-development
78. self-driving car
79. self-driving cars
80. self-driving minibus
81. self-driving vehicle
82. self-driving vehicles
83. self-efficacy
84. self-efficacy development
85. self-employed
86. self-employment
87. self-evaluation
88. self-fluxing alloy
89. self-governance
90. self-healing
91. self-heating phenomenon
92. self-identification
93. self-identity
94. self-improvement
95. self-insurance
96. self-learning
97. self-lubrication
98. self-management
99. self‐management
100. self-mixing
101. self-organisation
102. self-organised teams
103. self-organization
104. self-organized criticality
105. self-organized teams
106. self-perforating dowel
107. self-propagating high temperature synthesized (SHS)
108. Self-Propagating High-Temperature Synthesis
109. self-propulsion
110. self-regulated learning
111. self-regulation
112. self-reported musculoskeletal disorders
113. self-rolling
114. self-shading envelopes
115. self-sovereign
116. self-study
117. self-study courses
118. self-training
119. social self-development
120. solo self-employment
121. accelerated shelf-life test
122. adaptive test strategy generation
123. antigen test
124. Applications in Test Engineering
125. ASTM G65 dry sand rubber wheel abrasion test
126. automated test environment
127. automated test pattern generation
128. automatic test case generation
129. automatic test pattern generation
130. automatic test program generation
131. Auvergne test-bed
132. battery test
133. behavioral test
134. behaviour level test generation
135. bending test
136. bit-error rate test
137. Board and System Test
138. board test
139. bounds test
140. capillary condensation redistribution test
141. chi-square test
142. closed bottle test
143. cognitive screening test
144. compartment fire test
145. compartment test
146. cone penetration test (CPT)
147. COVID-19 antigen test
148. cutting test
149. cybersecurity test bed
150. DDR4 interconnect test
151. design and test
152. design-for-test
153. deterministic test sequences
154. diagnostic test
155. digital test
156. Digital test and testable design
157. double-pulse test
158. drawing test
159. dry droplet antimicrobial test
160. embedded test
161. fan pressurisation test
162. final test result prediction
163. four-point bending test
164. FPGA based test
165. FPGA-Assisted Test
166. FPGA-centric test
167. functional test generation
168. Granger causality test
169. hardness test
170. Hierarchical Multi-level Test Generation
171. high-level synthesis for test
172. high-level test data generation
173. highlevel test generation
174. high-speed serial link test
175. IEEE 9 bus test system
176. implementation-independent test generation
177. in situ tensile test in SEM
178. industrial field test
179. in-situ tensile test in SEM
180. Johansen cointegration test
181. Kolmogorov-Smirnov test
182. load test
183. Luria alternating series test
184. Mann–Kendall test
185. Mann-Kendall trend test
186. memory interconnect test
187. microprocessor test
188. Model test
189. multiplier test
190. offline test generation
191. orthogonal test
192. package test analysis
193. parallel design and test
194. performance test
195. piezocone penetration test (CPTu)
196. Point Load Test index
197. pressurisation test
198. processor-centric board test
199. progressive damage test
200. provably correct test generation
201. pseudo-exhaustive test
202. purity test
203. real-time room temperature test
204. rolling thin film oven test
205. rtioco-based timed test sequences
206. seasonal Mann Kendall test
207. seismic piezocone penetration test
208. sentence writing test
209. serial sevens test
210. ship towing test tank
211. similar material simulation test
212. small-scale fire test
213. small‐scale test
214. soil phosphorus (P) test
215. standard test method
216. static load test
217. static-dynamic probing test (SDT)
218. stress test
219. system level test
220. teaching design and test of systems
221. tensile test
222. tensile test
223. test
224. test and evaluation platform
225. test automation
226. test bench
227. test coverage
228. test driven development
229. test driven modelling
230. test embankment
231. test equipment
232. test generation
233. test generation and fault diagnosis
234. Test Group Generation for Detecting Multiple Faults
235. test groups
236. test model design
237. test optimization
238. test packets
239. test path synthesis
240. test patterns
241. test point insertion
242. test program generation
243. test reference year
244. test replication
245. test scenario description language
246. test-bed
247. test-chips
248. test-house
249. test-pattern
250. test-suite reduction
251. Three-point bending test
252. unit root test
253. usability platform test
254. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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