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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. As-built
11. as-built model
12. as-built survey
13. built environment
14. built environment and architecture
15. built environment investment
16. built environment skills needs
17. built in moisture
18. built-in moisture
19. Built-in transformer (BIT)
20. cultural built heritage
21. hand-built pottery
22. sustainable built environment
23. adolescent self-efficacy
24. association of local-self government
25. association of local-self governments
26. corporate energy self-sufficiency
27. covalent self-assembly in solid state
28. diffusion and self-trapping of charge carriers
29. digital self-determination
30. digital self-efficacy
31. digital self-interference cancellation
32. European charter of local self-government
33. European self-sovereign identity framework
34. high strength self-compacting concrete
35. income of self-employed
36. increased self-consumption
37. local self-government
38. nikel-based self-fluxing alloy
39. NiP self-lubricating coating
40. open self‐ventilated machines
41. optical self-mixing
42. OSV (open self‐ventilated) machines
43. perceived general self-efficacy
44. renewables self-consumption
45. Self assessment tool
46. self aware
47. self learning software
48. self learning system
49. Self organization
50. self organizing map
51. self organizing network
52. self regulating heating
53. self regulation
54. self-analysis
55. self-assembled monolayers
56. self-assembly
57. self-assessed quality of life
58. self-assessment
59. self-assessment tool
60. self-aware
61. self-aware contracts
62. self-aware systems
63. self-awareness
64. self-checking
65. self-cleaning surfaces
66. self-consistent channels
67. self-consumption
68. self-costs
69. self-defence
70. self-determination
71. self-determination theory
72. self-determination theory of work motivation
73. self-development
74. self-driving car
75. self-driving cars
76. self-driving minibus
77. self-driving vehicle
78. self-driving vehicles
79. self-efficacy
80. self-efficacy development
81. self-employed
82. self-employment
83. self-evaluation
84. self-fluxing alloy
85. self-governance
86. self-healing
87. self-heating phenomenon
88. self-identification
89. self-identity
90. self-improvement
91. self-insurance
92. self-learning
93. self-lubrication
94. self-management
95. self‐management
96. self-mixing
97. self-organisation
98. self-organised teams
99. self-organization
100. self-organized criticality
101. self-organized teams
102. self-perforating dowel
103. self-propagating high temperature synthesized (SHS)
104. Self-Propagating High-Temperature Synthesis
105. self-propulsion
106. self-regulated learning
107. self-regulation
108. self-reported musculoskeletal disorders
109. self-rolling
110. self-shading envelopes
111. self-study
112. self-study courses
113. self-training
114. social self-development
115. accelerated shelf-life test
116. adaptive test strategy generation
117. antigen test
118. Applications in Test Engineering
119. ASTM G65 dry sand rubber wheel abrasion test
120. automated test environment
121. automated test pattern generation
122. automatic test case generation
123. automatic test pattern generation
124. automatic test program generation
125. Auvergne test-bed
126. battery test
127. behavioral test
128. behaviour level test generation
129. bending test
130. bit-error rate test
131. Board and System Test
132. board test
133. bounds test
134. capillary condensation redistribution test
135. chi-square test
136. closed bottle test
137. cognitive screening test
138. compartment fire test
139. compartment test
140. cone penetration test (CPT)
141. COVID-19 antigen test
142. cutting test
143. cybersecurity test bed
144. DDR4 interconnect test
145. design and test
146. design-for-test
147. deterministic test sequences
148. diagnostic test
149. digital test
150. Digital test and testable design
151. double-pulse test
152. drawing test
153. dry droplet antimicrobial test
154. embedded test
155. fan pressurisation test
156. final test result prediction
157. four-point bending test
158. FPGA based test
159. FPGA-Assisted Test
160. FPGA-centric test
161. functional test generation
162. Granger causality test
163. hardness test
164. Hierarchical Multi-level Test Generation
165. high-level synthesis for test
166. high-level test data generation
167. highlevel test generation
168. high-speed serial link test
169. IEEE 9 bus test system
170. implementation-independent test generation
171. in situ tensile test in SEM
172. industrial field test
173. in-situ tensile test in SEM
174. Johansen cointegration test
175. Kolmogorov-Smirnov test
176. load test
177. Luria alternating series test
178. Mann–Kendall test
179. memory interconnect test
180. microprocessor test
181. Model test
182. multiplier test
183. offline test generation
184. orthogonal test
185. package test analysis
186. parallel design and test
187. performance test
188. piezocone penetration test (CPTu)
189. Point Load Test index
190. pressurisation test
191. processor-centric board test
192. progressive damage test
193. provably correct test generation
194. pseudo-exhaustive test
195. purity test
196. rolling thin film oven test
197. rtioco-based timed test sequences
198. seasonal Mann Kendall test
199. seismic piezocone penetration test
200. sentence writing test
201. serial sevens test
202. ship towing test tank
203. similar material simulation test
204. small-scale fire test
205. small‐scale test
206. soil phosphorus (P) test
207. standard test method
208. static load test
209. static-dynamic probing test (SDT)
210. stress test
211. system level test
212. teaching design and test of systems
213. tensile test
214. test
215. test and evaluation platform
216. test automation
217. test bench
218. test coverage
219. test driven development
220. test driven modelling
221. test embankment
222. test equipment
223. test generation
224. test generation and fault diagnosis
225. Test Group Generation for Detecting Multiple Faults
226. test groups
227. test model design
228. test optimization
229. test packets
230. test path synthesis
231. test patterns
232. test point insertion
233. test program generation
234. test reference year
235. test replication
236. test scenario description language
237. test-bed
238. test-chips
239. test-house
240. test-pattern
241. test-suite reduction
242. Three-point bending test
243. unit root test
244. usability platform test
245. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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