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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article EST / journal article ENG

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. Automated Synthesis of Software-based Self-test
4. functional self-test
5. self-test
6. self-test architectures
7. software based self-test
8. software-based self-test
9. software-based self-test (SBST)
10. As-built
11. as-built model
12. as-built survey
13. built environment
14. built environment and architecture
15. built environment investment
16. built environment skills needs
17. built in moisture
18. built-in moisture
19. Built-in transformer (BIT)
20. cultural built heritage
21. hand-built pottery
22. sustainable built environment
23. adolescent self-efficacy
24. association of local-self government
25. association of local-self governments
26. corporate energy self-sufficiency
27. covalent self-assembly in solid state
28. diffusion and self-trapping of charge carriers
29. digital self-determination
30. digital self-efficacy
31. digital self-interference cancellation
32. European charter of local self-government
33. European self-sovereign identity framework
34. high strength self-compacting concrete
35. income of self-employed
36. increased self-consumption
37. local self-government
38. nikel-based self-fluxing alloy
39. NiP self-lubricating coating
40. open self‐ventilated machines
41. optical self-mixing
42. OSV (open self‐ventilated) machines
43. perceived general self-efficacy
44. renewables self-consumption
45. Self assessment tool
46. self aware
47. self learning software
48. self learning system
49. Self organization
50. self organizing map
51. self organizing network
52. self regulating heating
53. self regulation
54. self-analysis
55. self-assembled monolayers
56. self-assembly
57. self-assessed quality of life
58. self-assessment
59. self-assessment tool
60. self-attribution
61. self-aware
62. self-aware contracts
63. self-aware systems
64. self-awareness
65. self-checking
66. self-cleaning surfaces
67. self-consistent channels
68. self-consumption
69. self-costs
70. self-defence
71. self-determination
72. self-determination theory
73. self-determination theory of work motivation
74. self-development
75. self-driving car
76. self-driving cars
77. self-driving minibus
78. self-driving vehicle
79. self-driving vehicles
80. self-efficacy
81. self-efficacy development
82. self-employed
83. self-employment
84. self-evaluation
85. self-fluxing alloy
86. self-governance
87. self-healing
88. self-heating phenomenon
89. self-identification
90. self-identity
91. self-improvement
92. self-insurance
93. self-learning
94. self-lubrication
95. self-management
96. self‐management
97. self-mixing
98. self-organisation
99. self-organised teams
100. self-organization
101. self-organized criticality
102. self-organized teams
103. self-perforating dowel
104. self-propagating high temperature synthesized (SHS)
105. Self-Propagating High-Temperature Synthesis
106. self-propulsion
107. self-regulated learning
108. self-regulation
109. self-reported musculoskeletal disorders
110. self-rolling
111. self-shading envelopes
112. self-sovereign
113. self-study
114. self-study courses
115. self-training
116. social self-development
117. solo self-employment
118. accelerated shelf-life test
119. adaptive test strategy generation
120. antigen test
121. Applications in Test Engineering
122. ASTM G65 dry sand rubber wheel abrasion test
123. automated test environment
124. automated test pattern generation
125. automatic test case generation
126. automatic test pattern generation
127. automatic test program generation
128. Auvergne test-bed
129. battery test
130. behavioral test
131. behaviour level test generation
132. bending test
133. bit-error rate test
134. Board and System Test
135. board test
136. bounds test
137. capillary condensation redistribution test
138. chi-square test
139. closed bottle test
140. cognitive screening test
141. compartment fire test
142. compartment test
143. cone penetration test (CPT)
144. COVID-19 antigen test
145. cutting test
146. cybersecurity test bed
147. DDR4 interconnect test
148. design and test
149. design-for-test
150. deterministic test sequences
151. diagnostic test
152. digital test
153. Digital test and testable design
154. double-pulse test
155. drawing test
156. dry droplet antimicrobial test
157. embedded test
158. fan pressurisation test
159. final test result prediction
160. four-point bending test
161. FPGA based test
162. FPGA-Assisted Test
163. FPGA-centric test
164. functional test generation
165. Granger causality test
166. hardness test
167. Hierarchical Multi-level Test Generation
168. high-level synthesis for test
169. high-level test data generation
170. highlevel test generation
171. high-speed serial link test
172. IEEE 9 bus test system
173. implementation-independent test generation
174. in situ tensile test in SEM
175. industrial field test
176. in-situ tensile test in SEM
177. Johansen cointegration test
178. Kolmogorov-Smirnov test
179. load test
180. Luria alternating series test
181. Mann–Kendall test
182. memory interconnect test
183. microprocessor test
184. Model test
185. multiplier test
186. offline test generation
187. orthogonal test
188. package test analysis
189. parallel design and test
190. performance test
191. piezocone penetration test (CPTu)
192. Point Load Test index
193. pressurisation test
194. processor-centric board test
195. progressive damage test
196. provably correct test generation
197. pseudo-exhaustive test
198. purity test
199. rolling thin film oven test
200. rtioco-based timed test sequences
201. seasonal Mann Kendall test
202. seismic piezocone penetration test
203. sentence writing test
204. serial sevens test
205. ship towing test tank
206. similar material simulation test
207. small-scale fire test
208. small‐scale test
209. soil phosphorus (P) test
210. standard test method
211. static load test
212. static-dynamic probing test (SDT)
213. stress test
214. system level test
215. teaching design and test of systems
216. tensile test
217. tensile test
218. test
219. test and evaluation platform
220. test automation
221. test bench
222. test coverage
223. test driven development
224. test driven modelling
225. test embankment
226. test equipment
227. test generation
228. test generation and fault diagnosis
229. Test Group Generation for Detecting Multiple Faults
230. test groups
231. test model design
232. test optimization
233. test packets
234. test path synthesis
235. test patterns
236. test point insertion
237. test program generation
238. test reference year
239. test replication
240. test scenario description language
241. test-bed
242. test-chips
243. test-house
244. test-pattern
245. test-suite reduction
246. Three-point bending test
247. unit root test
248. usability platform test
249. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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