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book article

At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]

book article
2

book article

Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei; Wuttke, Heinz-DietrichInternational Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal2007 / [7] p. : ill. [CD-ROM] http://icee2007.dei.uc.pt/proceedings/papers/429.pdf

book article
3

journal article

Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill http://dx.doi.org/10.1016/j.micpro.2014.11.002

journal article
4

book article EST / book article ENG

Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentationOyeniran, Adeboye Stephen; Azad, Siavoosh Payandeh; Ubar, Raimund-Johannes2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings2018 / 5 p.: ill https://doi.org/10.1109/ISCAS.2018.8350936 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG
5

book article

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article
6

book article

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

book article
7

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 7, displaying 1 - 7

1. built-in self-test
2. logic built-in self-test
3. functional self-test
4. self-test
5. self-test architectures
6. software based self-test
7. software-based self-test
8. software-based self-test (SBST)
9. As-built
10. as-built model
11. built environment
12. built environment and architecture
13. built environment investment
14. built environment skills needs
15. built in moisture
16. built-in moisture
17. Built-in transformer (BIT)
18. cultural built heritage
19. sustainable built environment
20. adolescent self-efficacy
21. association of local-self government
22. association of local-self governments
23. corporate energy self-sufficiency
24. covalent self-assembly in solid state
25. diffusion and self-trapping of charge carriers
26. digital self-determination
27. digital self-efficacy
28. digital self-interference cancellation
29. European charter of local self-government
30. European self-sovereign identity framework
31. high strength self-compacting concrete
32. income of self-employed
33. increased self-consumption
34. local self-government
35. nikel-based self-fluxing alloy
36. NiP self-lubricating coating
37. open self‐ventilated machines
38. optical self-mixing
39. OSV (open self‐ventilated) machines
40. perceived general self-efficacy
41. renewables self-consumption
42. Self assessment tool
43. self aware
44. self learning software
45. self learning system
46. Self organization
47. self organizing map
48. self organizing network
49. self regulating heating
50. self regulation
51. self-analysis
52. self-assembled monolayers
53. self-assembly
54. self-assessed quality of life
55. self-assessment
56. self-assessment tool
57. self-aware
58. self-aware contracts
59. self-aware systems
60. self-awareness
61. self-checking
62. self-cleaning surfaces
63. self-consistent channels
64. self-consumption
65. self-costs
66. self-defence
67. self-determination
68. self-determination theory
69. self-determination theory of work motivation
70. self-development
71. self-driving car
72. self-driving cars
73. self-driving minibus
74. self-driving vehicle
75. self-driving vehicles
76. self-efficacy
77. self-efficacy development
78. self-employed
79. self-employment
80. self-evaluation
81. self-fluxing alloy
82. self-governance
83. self-healing
84. self-heating phenomenon
85. self-identification
86. self-identity
87. self-improvement
88. self-insurance
89. self-learning
90. self-lubrication
91. self-management
92. self‐management
93. self-mixing
94. self-organisation
95. self-organised teams
96. self-organization
97. self-organized criticality
98. self-organized teams
99. self-perforating dowel
100. self-propagating high temperature synthesized (SHS)
101. Self-Propagating High-Temperature Synthesis
102. self-propulsion
103. self-regulated learning
104. self-regulation
105. self-reported musculoskeletal disorders
106. self-rolling
107. self-shading envelopes
108. self-study
109. self-study courses
110. self-training
111. social self-development
112. accelerated shelf-life test
113. adaptive test strategy generation
114. antigen test
115. ASTM G65 dry sand rubber wheel abrasion test
116. automated test environment
117. automated test pattern generation
118. automatic test case generation
119. automatic test pattern generation
120. automatic test program generation
121. Auvergne test-bed
122. battery test
123. behavioral test
124. behaviour level test generation
125. bending test
126. bit-error rate test
127. Board and System Test
128. board test
129. bounds test
130. capillary condensation redistribution test
131. chi-square test
132. closed bottle test
133. cognitive screening test
134. compartment fire test
135. compartment test
136. cone penetration test (CPT)
137. COVID-19 antigen test
138. cutting test
139. cybersecurity test bed
140. DDR4 interconnect test
141. design and test
142. design-for-test
143. deterministic test sequences
144. diagnostic test
145. digital test
146. Digital test and testable design
147. double-pulse test
148. drawing test
149. dry droplet antimicrobial test
150. embedded test
151. fan pressurisation test
152. final test result prediction
153. four-point bending test
154. FPGA based test
155. FPGA-Assisted Test
156. FPGA-centric test
157. functional test generation
158. Granger causality test
159. hardness test
160. high-level synthesis for test
161. high-level test data generation
162. highlevel test generation
163. high-speed serial link test
164. IEEE 9 bus test system
165. implementation-independent test generation
166. in situ tensile test in SEM
167. industrial field test
168. in-situ tensile test in SEM
169. Johansen cointegration test
170. Kolmogorov-Smirnov test
171. load test
172. Luria alternating series test
173. Mann–Kendall test
174. memory interconnect test
175. microprocessor test
176. Model test
177. multiplier test
178. offline test generation
179. orthogonal test
180. package test analysis
181. parallel design and test
182. performance test
183. piezocone penetration test (CPTu)
184. Point Load Test index
185. pressurisation test
186. processor-centric board test
187. progressive damage test
188. provably correct test generation
189. pseudo-exhaustive test
190. purity test
191. rtioco-based timed test sequences
192. seasonal Mann Kendall test
193. seismic piezocone penetration test
194. sentence writing test
195. serial sevens test
196. ship towing test tank
197. similar material simulation test
198. small-scale fire test
199. small‐scale test
200. soil phosphorus (P) test
201. standard test method
202. static load test
203. static-dynamic probing test (SDT)
204. stress test
205. system level test
206. teaching design and test of systems
207. tensile test
208. test
209. test and evaluation platform
210. test automation
211. test bench
212. test coverage
213. test driven development
214. test driven modelling
215. test embankment
216. test equipment
217. test generation
218. test generation and fault diagnosis
219. test groups
220. test model design
221. test optimization
222. test packets
223. test path synthesis
224. test patterns
225. test point insertion
226. test program generation
227. test reference year
228. test replication
229. test scenario description language
230. test-bed
231. test-chips
232. test-house
233. test-pattern
234. test-suite reduction
235. Three-point bending test
236. unit root test
237. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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