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package test analysis (keyword)
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1
book article
Elaboration of framework for green and cost efficient package development for electronic industry
Ševtšenko, Eduard
;
Karaulova, Tatjana
;
Pohlak, Meelis
;
Mahmood, Kashif
International Conference on Innovative Technologies : IN-TECH 2016 : Prague : proceedings
2016
/
p. 239-242 : ill
http://www.in-tech.info/download/INTECH_2016_proceedings.pdf
book article
Number of records 1, displaying
1 - 1
keyword
138
1.
package test analysis
2.
Amber package
3.
common regulative package
4.
green package
5.
package design solution
6.
package integration
7.
third energy package
8.
accelerated shelf-life test
9.
adaptive test strategy generation
10.
antigen test
11.
ASTM G65 dry sand rubber wheel abrasion test
12.
automated test environment
13.
automated test pattern generation
14.
automatic test case generation
15.
automatic test pattern generation
16.
automatic test program generation
17.
Auvergne test-bed
18.
battery test
19.
behavioral test
20.
behaviour level test generation
21.
bending test
22.
bit-error rate test
23.
Board and System Test
24.
board test
25.
bounds test
26.
built-in self-test
27.
capillary condensation redistribution test
28.
chi-square test
29.
closed bottle test
30.
cognitive screening test
31.
compartment fire test
32.
compartment test
33.
cone penetration test (CPT)
34.
COVID-19 antigen test
35.
cutting test
36.
cybersecurity test bed
37.
DDR4 interconnect test
38.
design and test
39.
design-for-test
40.
deterministic test sequences
41.
diagnostic test
42.
digital test
43.
Digital test and testable design
44.
double-pulse test
45.
drawing test
46.
dry droplet antimicrobial test
47.
embedded test
48.
fan pressurisation test
49.
final test result prediction
50.
four-point bending test
51.
FPGA based test
52.
FPGA-Assisted Test
53.
FPGA-centric test
54.
functional self-test
55.
functional test generation
56.
Granger causality test
57.
hardness test
58.
high-level synthesis for test
59.
high-level test data generation
60.
highlevel test generation
61.
high-speed serial link test
62.
IEEE 9 bus test system
63.
implementation-independent test generation
64.
in situ tensile test in SEM
65.
industrial field test
66.
in-situ tensile test in SEM
67.
Johansen cointegration test
68.
Kolmogorov-Smirnov test
69.
load test
70.
logic built-in self-test
71.
Luria alternating series test
72.
Mann–Kendall test
73.
memory interconnect test
74.
microprocessor test
75.
Model test
76.
multiplier test
77.
offline test generation
78.
orthogonal test
79.
parallel design and test
80.
performance test
81.
piezocone penetration test (CPTu)
82.
Point Load Test index
83.
pressurisation test
84.
processor-centric board test
85.
progressive damage test
86.
provably correct test generation
87.
pseudo-exhaustive test
88.
purity test
89.
rtioco-based timed test sequences
90.
seasonal Mann Kendall test
91.
seismic piezocone penetration test
92.
self-test
93.
self-test architectures
94.
sentence writing test
95.
serial sevens test
96.
ship towing test tank
97.
similar material simulation test
98.
small‐scale test
99.
software based self-test
100.
software-based self-test
101.
software-based self-test (SBST)
102.
soil phosphorus (P) test
103.
standard test method
104.
static load test
105.
static-dynamic probing test (SDT)
106.
stress test
107.
system level test
108.
teaching design and test of systems
109.
tensile test
110.
test
111.
test and evaluation platform
112.
test bench
113.
test coverage
114.
test driven development
115.
test driven modelling
116.
test embankment
117.
test equipment
118.
test generation
119.
test generation and fault diagnosis
120.
test groups
121.
test model design
122.
test optimization
123.
test packets
124.
test path synthesis
125.
test patterns
126.
test point insertion
127.
test program generation
128.
test reference year
129.
test replication
130.
test scenario description language
131.
test-bed
132.
test-chips
133.
test-house
134.
test-pattern
135.
test-suite reduction
136.
Three-point bending test
137.
unit root test
138.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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