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FPGA based test (keyword)
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book article
A new FPGA-based detection method for spurious variations in PCBA power distribution network
Odintsov, Sergei
;
Bozzoli, Ludovica
;
De Sio, Corrado
;
Sterpone, Luca
;
Jutman, Artur
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/DDECS.2019.8724662
book article
Number of records 1, displaying
1 - 1
keyword
158
1.
FPGA based test
2.
FPGA-Assisted Test
3.
FPGA-centric test
4.
FPGA based lab kit
5.
FPGA-based development boards
6.
FPGA-based prototyping
7.
Automated Synthesis of Software-based Self-test
8.
rtioco-based timed test sequences
9.
software based self-test
10.
software-based self-test
11.
software-based self-test (SBST)
12.
Field Programmable Gate Array (FPGA)
13.
Field-Programmable Gate Array (FPGA)
14.
field-programmable gate arrays (FPGA)
15.
FPGA
16.
FPGA (field-programmable gate array)
17.
FPGA implementation
18.
FPGA redaction
19.
FPGA/PSoC design
20.
FPGA-Embedded Instrument
21.
Opal Kelly field programmable gate array (FPGA)
22.
recycled FPGA detection
23.
SoC FPGA
24.
accelerated shelf-life test
25.
adaptive test strategy generation
26.
antigen test
27.
Applications in Test Engineering
28.
ASTM G65 dry sand rubber wheel abrasion test
29.
automated test environment
30.
automated test pattern generation
31.
automatic test case generation
32.
automatic test pattern generation
33.
automatic test program generation
34.
Auvergne test-bed
35.
battery test
36.
behavioral test
37.
behaviour level test generation
38.
bending test
39.
bit-error rate test
40.
Board and System Test
41.
board test
42.
bounds test
43.
built-in self-test
44.
capillary condensation redistribution test
45.
chi-square test
46.
closed bottle test
47.
cognitive screening test
48.
compartment fire test
49.
compartment test
50.
cone penetration test (CPT)
51.
COVID-19 antigen test
52.
cutting test
53.
cybersecurity test bed
54.
DDR4 interconnect test
55.
design and test
56.
design-for-test
57.
deterministic test sequences
58.
diagnostic test
59.
digital test
60.
Digital test and testable design
61.
double-pulse test
62.
drawing test
63.
dry droplet antimicrobial test
64.
embedded test
65.
fan pressurisation test
66.
final test result prediction
67.
four-point bending test
68.
functional self-test
69.
functional test generation
70.
Granger causality test
71.
hardness test
72.
Hierarchical Multi-level Test Generation
73.
high-level synthesis for test
74.
high-level test data generation
75.
highlevel test generation
76.
high-speed serial link test
77.
IEEE 9 bus test system
78.
implementation-independent test generation
79.
in situ tensile test in SEM
80.
industrial field test
81.
in-situ tensile test in SEM
82.
Johansen cointegration test
83.
Kolmogorov-Smirnov test
84.
load test
85.
logic built-in self-test
86.
Luria alternating series test
87.
Mann–Kendall test
88.
Mann-Kendall trend test
89.
memory interconnect test
90.
microprocessor test
91.
Model test
92.
multiplier test
93.
offline test generation
94.
orthogonal test
95.
package test analysis
96.
parallel design and test
97.
performance test
98.
piezocone penetration test (CPTu)
99.
Point Load Test index
100.
pressurisation test
101.
processor-centric board test
102.
progressive damage test
103.
provably correct test generation
104.
pseudo-exhaustive test
105.
purity test
106.
real-time room temperature test
107.
rolling thin film oven test
108.
seasonal Mann Kendall test
109.
seismic piezocone penetration test
110.
self-test
111.
self-test architectures
112.
sentence writing test
113.
serial sevens test
114.
ship towing test tank
115.
similar material simulation test
116.
small-scale fire test
117.
small‐scale test
118.
soil phosphorus (P) test
119.
standard test method
120.
static load test
121.
static-dynamic probing test (SDT)
122.
stress test
123.
system level test
124.
teaching design and test of systems
125.
tensile test
126.
tensile test
127.
test
128.
test and evaluation platform
129.
test automation
130.
test bench
131.
test coverage
132.
test driven development
133.
test driven modelling
134.
test embankment
135.
test equipment
136.
test generation
137.
test generation and fault diagnosis
138.
Test Group Generation for Detecting Multiple Faults
139.
test groups
140.
test model design
141.
test optimization
142.
test packets
143.
test path synthesis
144.
test patterns
145.
test point insertion
146.
test program generation
147.
test reference year
148.
test replication
149.
test scenario description language
150.
test-bed
151.
test-chips
152.
test-house
153.
test-pattern
154.
test-suite reduction
155.
Three-point bending test
156.
unit root test
157.
usability platform test
158.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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