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book article

Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

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Number of records 3, displaying 1 - 3

1. accelerated shelf-life test
2. adaptive test strategy generation
3. antigen test
4. Applications in Test Engineering
5. ASTM G65 dry sand rubber wheel abrasion test
6. Automated Synthesis of Software-based Self-test
7. automated test environment
8. automated test pattern generation
9. automatic test case generation
10. automatic test pattern generation
11. automatic test program generation
12. Auvergne test-bed
13. battery test
14. behavioral test
15. behaviour level test generation
16. bending test
17. bit-error rate test
18. Board and System Test
19. board test
20. bounds test
21. built-in self-test
22. capillary condensation redistribution test
23. chi-square test
24. closed bottle test
25. cognitive screening test
26. compartment fire test
27. compartment test
28. cone penetration test (CPT)
29. COVID-19 antigen test
30. cutting test
31. cybersecurity test bed
32. DDR4 interconnect test
33. design and test
34. design-for-test
35. deterministic test sequences
36. diagnostic test
37. digital test
38. Digital test and testable design
39. double-pulse test
40. drawing test
41. dry droplet antimicrobial test
42. embedded test
43. fan pressurisation test
44. final test result prediction
45. four-point bending test
46. FPGA based test
47. FPGA-Assisted Test
48. FPGA-centric test
49. functional self-test
50. functional test generation
51. Granger causality test
52. hardness test
53. Hierarchical Multi-level Test Generation
54. high-level synthesis for test
55. high-level test data generation
56. highlevel test generation
57. high-speed serial link test
58. IEEE 9 bus test system
59. implementation-independent test generation
60. in situ tensile test in SEM
61. industrial field test
62. in-situ tensile test in SEM
63. Johansen cointegration test
64. Kolmogorov-Smirnov test
65. load test
66. logic built-in self-test
67. Luria alternating series test
68. Mann–Kendall test
69. Mann-Kendall trend test
70. memory interconnect test
71. microprocessor test
72. Model test
73. multiplier test
74. offline test generation
75. orthogonal test
76. package test analysis
77. parallel design and test
78. performance test
79. piezocone penetration test (CPTu)
80. Point Load Test index
81. pressurisation test
82. processor-centric board test
83. progressive damage test
84. provably correct test generation
85. pseudo-exhaustive test
86. purity test
87. rolling thin film oven test
88. rtioco-based timed test sequences
89. seasonal Mann Kendall test
90. seismic piezocone penetration test
91. self-test
92. self-test architectures
93. sentence writing test
94. serial sevens test
95. ship towing test tank
96. similar material simulation test
97. small-scale fire test
98. small‐scale test
99. software based self-test
100. software-based self-test
101. software-based self-test (SBST)
102. soil phosphorus (P) test
103. standard test method
104. static load test
105. static-dynamic probing test (SDT)
106. stress test
107. system level test
108. teaching design and test of systems
109. tensile test
110. tensile test
111. test
112. test and evaluation platform
113. test automation
114. test bench
115. test coverage
116. test driven development
117. test driven modelling
118. test embankment
119. test equipment
120. test generation
121. test generation and fault diagnosis
122. Test Group Generation for Detecting Multiple Faults
123. test groups
124. test model design
125. test optimization
126. test packets
127. test path synthesis
128. test patterns
129. test point insertion
130. test program generation
131. test reference year
132. test replication
133. test scenario description language
134. test-bed
135. test-chips
136. test-house
137. test-pattern
138. test-suite reduction
139. Three-point bending test
140. unit root test
141. usability platform test
142. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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