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testimine (subject term)
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251
book article
Functional test generation for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
;
Jutman, Artur
;
Raik, Jaan
;
Bengtsson, Tomas
;
Kumar, Shashi
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 205-208 : ill
book article
252
book article
Functional test program generation for digital systems
Ubar, Raimund-Johannes
;
Dušina, Julia
;
Krupnova, Helena
;
Storožev, Sergei
;
Zaugarov, Viktor
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : proceedings of the 6th workshop, Vaals (Niederlande), March 6-8, 1994
1994
/
p. 14-18: ill
book article
253
book article
GA-based test generation for sequential circuits
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
Proceedings of East–West Design & Test Workshop (EWDTW’04) : Yalta, Alushta, Crimea, Ukraine, September 23-26, 2004
2004
/
p. 30-34
book article
254
book article
Generating directed tests for C programs using RTL ATPG
Raik, Jaan
;
Drenkhan, Tiia
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Karputkin, Anton
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 13th Workshop on RTL and High Level Testing (WRTLT'12)
2012
/
p. 1-6
book article
255
book article
Generating optimal test cases for real-time systems using DIVINE model checker
Pal, Deepak
;
Vain, Jüri
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 99-102 : ill
http://www.ester.ee/record=b2150914*est
book article
256
book article
Generating TTCN-3 test cases from EFSM models of reactive software using model checking
Ernits, Juhan-Peep
;
Kull, Andres
;
Raiend, Kullo
;
Vain, Jüri
Informatik 2006 - Informatik für Menschen : proceedings : Beiträge der 36. Jahrestagung der Gesellschaft für Informatik e.V.(GI) : 2.bis 6.Oktober in Dresden
2006
/
p. 241-248
https://www.semanticscholar.org/paper/Generating-TTCN-3-Test-Cases-from-EFSM-Models-of-Ernits-Kull/b626c55f607826939345eec24e985adf268b15e5
book article
257
book article
Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault model
Ubar, Raimund-Johannes
;
Borrione, Dominique
XI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings
1998
/
p. 51-54
https://ieeexplore.ieee.org/document/715409
book article
258
book article
A generic synthesizable NoC switch with a scalable testbench
Govind, Vineeth
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 91-94 : ill
book article
259
book article
A global methodology for test program generation starting from high level specifications
Storojev, Sergei
;
Leveugle, Regis
;
Saucier, Gabriele
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 305-311: ill
https://www.ester.ee/record=b2150914*est
book article
260
journal article EST
/
journal article ENG
A global survey of standardization and industry practices of automotive cybersecurity validation and verification testing processes and tools
Roberts, Andrew James
;
Marksteiner, Stefan
;
Soyturk, Mujdat
;
Yaman, Berkay
;
Yang, Yi
SAE international journal of connected and automated vehicles
2023
/
art. 12-07-02-0013
https://doi.org/10.4271/12-07-02-0013
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
Related publications
1
Cybersecurity testing and attack propagation analysis of autonomous driving software = Autonoomse sõiduki juhtimistarkvara küberturvalisuse testimine ja rünnakute leviku analüüs
261
book article
Guardbands in random testing
Kemnitz, Günter
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 85-88: ill
book article
262
journal article
Guardbands in random testing
Kemnitz, Günter
Proceedings of the Estonian Academy of Sciences. Engineering
1997
/
4, p. 260-270: ill
journal article
263
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
264
book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
https://ieeexplore.ieee.org/document/4669309
book article
265
book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
book article
266
book article
A hierarchical automatic test pattern generator based on using alternative graphs
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
1997
/
p. 415-420
book article
267
book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
268
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
https://ieeexplore.ieee.org/document/873781
book article
269
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
270
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
271
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
272
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
273
book article
Hierarchical test generation for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Mixed design of integrated circuits and systems
1998
/
p. 131-136: ill
https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20
book article
274
book article
Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
Raik, Jaan
;
Ubar, Raimund-Johannes
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
1998
/
p. 374-381: ill
book article
275
book article
Hierarchical test generation for finite state machines
Brik, Marina
;
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 319-324: ill
book article
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