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testimine (subject term)
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351
journal article
Kütuste testimisest
Poobus, Arvi
;
Tiikma, Toomas
Tehnika ja Tootmine
1995
/
5, lk. 25-28: ill
journal article
352
book article
Laboratory course for training "Digital design and test"
Ubar, Raimund-Johannes
;
Tulit, Viljar
;
Buldas, Ahto
;
Saarepera, Märt
Fourth EUROCHIP Workshop on VLSI Design Training, 29 September to 1 October 1993, Toledo : [proceedings]
1993
/
p. 112-117: ill
book article
353
book article
Laboratory framework TEAM for investigating the dependability issues of microprocessor systems
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Kruus, Helena
10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia
2014
/
p. 80-83 : ill
book article
354
book article EST
/
book article ENG
Laboratory tests and modelling of mineral wool insulated steel sandwich panels
Laukkarinen, Anssi
;
Vinha, Juha
;
Kalbe, Kristo
;
Kalamees, Targo
E3S Web of Conferences : 12th Nordic Symposium on Building Physics (NSB 2020) : Tallinn, Estonia, September 6-9, 2020
2020
/
art. 17006, 8 p. : ill
https://doi.org/10.1051/e3sconf/202017217006
Conference proceedings at Scopus
Article at Scopus
Conference proceedings at WOS
Article at WOS
book article EST
/
book article ENG
355
book article
Laboratory training for teaching design and test of digital circuits
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 521-524 : ill
https://pld.ttu.ee/~artur/papers/TestLabs-MIXDES01.pdf
book article
356
journal article
Ladestatava prügi leostustestimisalasest koostööst
Wahlström, Margareta
;
Laine-Ylijoki, Jutta
;
Hjelmar, Ole
;
Nuutre, Maaris
;
Loosaar, Jüri
Keskkonnatehnika
2003
/
5, lk. 43-47
https://artiklid.elnet.ee/record=b1014022*est
journal article
357
newspaper article
Lasnamäel saab testida isesõitvat bussi [Võrguväljaanne]
Autonet.ee
2022
"Lasnamäel saab testida isesõitvat bussi"
newspaper article
358
journal article
Learning digital test and diagnostics via internet [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Kruus, Margus
;
Orasson, Elmet
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International journal of computing & information sciences
2006
/
2, p. 86-96 : ill
journal article
359
book article
A library of samples for testing variable load electric drives
Liivik, Liisa
;
Vodovozov, Valery
;
Rassõlkin, Anton
Digest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering
2013
/
p. 12.1-12.6 : ill
book article
360
journal article
Liginullenergiahoone - meie majaehituse lähitulevik : [TTÜ testhoonest]
Inseneeria
2013
/
lk. 14 : ill
journal article
361
book article
Linear algorithms for testing superpositional graphs
Peder, Ahti
;
Nestra, Härmel
;
Raik, Jaan
;
Tombak, Mati
;
Ubar, Raimund-Johannes
Proceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland
2011
/
p. 111-118 : ill
book article
362
book article
Low-area boundary BIST architecture for mesh-like network-on-chip
Raik, Jaan
;
Govind, Vineeth
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 95-100 : ill
book article
363
book article
Low-cost CAD software for teaching digital test
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Paomets, Priidu
First European Workshop on Microelectronics Education, Villard de Lans, France, February 5-6, 1996 : proceedings
1996
/
p. 48
book article
364
newspaper article
Lääne-Virumaal katsetatav kaevandusrobot säästab keskkonda
Nikolajev, Jüri
err.ee
2023
Lääne-Virumaal katsetatav kaevandusrobot säästab keskkonda
newspaper article
365
book article
Mapping faults in hierarchical testing of digital systems
Ubar, Raimund-Johannes
International Conference on Computer, Communication and Control Technologies CCCT'03 and the 9th International Conference on Information Systems, Analysis and Synthesis ISAS'03 : July 31 - August 1-2, Orlando, Florida, USA : proceedings. Volume I, Computing/Information Systems and Technologies
2003
/
p. 14-19 : ill
book article
366
book article
Mapping physical defects to logic level for defect oriented testing
Ubar, Raimund-Johannes
SCS 2003 : International Symposium on Signals, Circuits and Systems : July 10-11, 2003, Iasi, Romania : proceedings. Vol. 2
2003
/
p. 453-456 : ill
https://ieeexplore.ieee.org/document/5731320
book article
367
journal article EST
/
journal article ENG
Material characterization for laminated glass composite panel
Väer, Kaur
;
Anton, Johan
;
Klauson, Aleksander
;
Eerme, Martin
;
Õunapuu, Erko
;
Tšukrejev, Pavel
Journal of achievements in materials and manufacturing engineering
2017
/
p. 11-17
https://doi.org/10.5604/01.3001.0010.2032
Journal metrics at Scopus
Article at Scopus
journal article EST
/
journal article ENG
368
book article
MCM-test
Magnhagen, Bengt
;
Linden, Henric
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 297-304: ill
book article
369
book article
Measuring mining influence in the form of students practice in opposition to the emotional environmental impact assessment
Robam, Karin
;
Väizene, Vivika
;
Anepaio, Ain
;
Kolats, Margit
;
Valgma, Ingo
5th International Symposium "Topical Problems in the Field of Electrical and Power Engineering". Doctoral School of Energy and Geotechnology : Kuressaare, January 14-19, 2008
2008
/
p. 62-65 : ill
book article
370
journal article
Meie igapäevane testimine
Markvardt, Maili
A & A
2010
/
3, lk. 5-11
https://artiklid.elnet.ee/record=b2183723*est
journal article
371
book article
A method for crosstalk fault detection in on-chip buses
Bengtsson, Tomas
;
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Kumar, Shashi
Norchip : proceedings : Oulu, Finland, 21-22 November 2005
2005
/
p. 285-288 : ill
https://doi.org/10.1109/NORCHP.2005.1597045
book article
372
book article
A method for identification dynamic parameters of mixed signal circuits
Zagursky, V.
;
Semyonova, N.
;
Gertners, A.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 211-215
https://www.ester.ee/record=b2150914*est
book article
373
book article
A method for testing dynamic characteristics of analog-digital converters in spectral domain
Zagursky, V.
;
Semyonova, N.
;
Gertners, A.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 207-210
https://www.ester.ee/record=b2150914*est
book article
374
book article
Method for testing the brain
Hinrikus, Hiie
;
Bachmann, Maie
;
Lass, Jaanus
;
Tuulik, Viiu
;
Ubar, Raimund-Johannes
5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary
2012
/
p. 1198-1201 : ill
book article
375
book article
Microprocessor-based system test using debug interface
Devadze, Sergei
;
Jutman, Artur
;
Tšertov, Anton
;
Instenberg, Martin
;
Ubar, Raimund-Johannes
26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings
2008
/
p. 98-101 : ill
http://dx.doi.org/10.1109/NORCHP.2008.4738291
book article
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